LMT90

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SNIS177A – MARCH 2013 – REVISED AUGUST 2013

ELECTRICAL CHARACTERISTICS

UNITS

PARAMETER

CONDITIONS

TYPICAL

(LIMIT)

±3.0

°C (max)

±4.0

°C (max)

±4.0

°C (max)

±0.8

°C (max)

Sensor Gain

+9.7

mV/°C (min)

(Average Slope)

+10.3

mV/°C (max)

Output Resistance

2000

4000

Ω (max)

±0.8

mV/V (max)

+4.5V

±1.2

mV/V (max)

+4.5V

130

μA (max)

180

μA (max)

+4.5V

2.0

μA (max)

Temperature Coefficient of Quiescent Current

+2.0

μA/°C

±0.08

°C

(1)

Limits are specific to TI's AOQL (Average Outgoing Quality Level).

(2)

Accuracy is defined as the error between the output voltage and 10mv/°C times the device's case temperature plus 500 mV, at specified

conditions of voltage, current, and temperature (expressed in °C).

(3)

Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the device's

rated temperature range.

(4)

Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating

effects can be computed by multiplying the internal dissipation by the thermal resistance.

(5)

Quiescent current is defined in the circuit of Figure 2.

(6)

For best long-term stability, any precision circuit will give best results if the unit is aged at a warm temperature, and/or temperature

cycled for at least 46 hours before long-term life test begins. This is especially true when a small (Surface-Mount) part is wave-soldered;

allow time for stress relaxation to occur. The majority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after

1000 hours will not continue at the first 1000 hour rate.

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