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APW7176 Datasheet(PDF) 2 Page - Anpec Electronics Coropration |
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APW7176 Datasheet(HTML) 2 Page - Anpec Electronics Coropration |
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2 / 16 page ![]() Copyright © ANPEC Electronics Corp. Rev. A.1 - Mar., 2011 APW7176 www.anpec.com.tw 2 Absolute Maximum Ratings (Note 1) Symbol Parameter Rating Unit VIN1/IN2 Input Supply Voltage (IN1/IN2 to GND1/GND2) -0.3 ~ 6 V VFB1/FB2 Voltage on FB1 and FB2 (FB1/FB2 to GND1/GND2) -0.3 ~ VIN1/IN2+0.3 V VEN1/EN2 Voltage on EN1 and EN2 (EN1/EN2 to GND1/GND2) -0.3 ~ VIN1/IN2+0.3 V VSW1/SW2 Voltage on SW1 and SW2 (SW1/SW2 to GND1/GND2) -0.3 ~ VIN1/IN2+0.3 V ISW_PEAK Peak SW Current 1.8 A PD Maximum Power Dissipation (TA=25 oC) 2 W TJ Maximum Junction Temperature 150 °C TSTG Storage Temperature Range -65 ~ 150 °C TSDR Maximum Lead Soldering Temperature, 10 Seconds 260 °C Symbol Parameter Typical Value Unit θ JA Junction-to-Ambient Resistance in Free Air (Note 2) TDFN3x3-10 50 θ JC Junction-to-Case Resistance in Free Air TDFN3x3-10 12 °C/W Thermal Characteristics Note 2: θ JA is measured on with the device mounted the PCB with top-layer pad of approximate 1” square of 1 oz copper. Recommended Operating Conditions Symbol Parameter Range Unit VIN1/IN2 Input Supply Voltage (IN1/IN2 to GND1/GND2) 2.7 ~ 5.5 V R2/R4 Feedback Resistance (Note 3) ~ 300 k Ω IOUT Output Current 0 ~ 1 A TA Operating Ambient Temperature -40 ~ 85 °C TJ Operating Junction Temperature -40 ~ 125 °C Electrical Characteristics APW7176 Symbol Parameter Test Conditions Min. Typ. Max. Unit VIN1/IN2 Each Converter Input Voltage Range 2.7 - 5.5 V IFB1/FB2 FB1/FB2 Input Current VFB1/FB2=0.6V -30 - 30 nA VREF1/REF2 Each Converter Reference Voltage IOUT=0mA~1A 0.588 0.6 0.612 V ∆V REF1/REF2 Each Converter Reference Voltage Line Regulation -40 oC ≤T A ≤85 oC - 0.04 - %/V IPK Each Converter Peak Inductor Current VIN1/IN2=3.3V, VFB=0.5V or VOUT=90%, Duty cycle < 35% 1.4 1.6 - A The denotes the specifications that apply over V IN=3.6V and TA =25°C, unless otherwise specifications. Note 1: Absolute Maximum Ratings are those values beyond which the life of a device may be impaired. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Note 3: Please refer to the typical application circuit. |
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