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CMF05 Datasheet(PDF) 2 Page - Toshiba Semiconductor |
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CMF05 Datasheet(HTML) 2 Page - Toshiba Semiconductor |
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2 / 6 page ![]() CMF05 2010-02-17 2 Electrical Characteristics (Ta = 25°C) Characteristic Symbol Test Condition Min Typ. Max Unit Peak forward voltage VFM IFM = 0.5 A (pulse test) ⎯ ⎯ 2.7 V Repetitive peak reverse current IRRM VRRM = 800 V (pulse test) ⎯ ⎯ 50 μA Reverse recovery time trr IF = 1 A, di/dt = −30 A/μs ⎯ ⎯ 100 ns Forward recovery time tfr IF = 1 A ⎯ 550 ⎯ ns Device mounted on a ceramic board (board size: 50 mm × 50 mm) (soldering land: 2 mm × 2 mm) (board thickness: 0.64 mm) ⎯ ⎯ 60 Device mounted on a glass-epoxy board (board size: 50 mm × 50 mm) (soldering land: 6 mm × 6 mm) (board thickness: 1.6 mm ) ⎯ ⎯ 135 Thermal resistance Rth (j-a) Device mounted on a glass-epoxy board (board size: 50 mm × 50 mm) (soldering land: 2.1 mm × 1.4 mm) (board thickness: 1.6 mm) ⎯ ⎯ 210 °C/W Thermal resistance (junction to lead) Rth (j-ℓ) ⎯ ⎯ ⎯ 16 °C/W Marking Standard Soldering Pad Abbreviation Code Part No. F5 CMF05 Handling Precautions 1) The absolute maximum ratings of a semiconductor device are a set of ratings that must not be exceeded, even for a moment. Do not exceed any of these ratings. The following are the general derating methods we recommend for designing a circuit using this device. VRRM: We recommend that the worst-case voltage, including surge voltage, be no greater than 80% of the absolute maximum rating of VRRM for a DC circuit; and no greater than 50% of that of VRRM for an AC circuit. VRRM has a temperature coefficient (0.1%/℃). Be sure to take this temperature coefficient into account when designing a device for use at low temperature. IF(AV): We recommend that the worst case current be no greater than 80% of the absolute maximum rating of IF(AV). Carry out sufficient heat design. If it is not possible to design a circuit with excellent heat radiation, set a margin by using an allowable Ta max-IF(AV) curve. IFSM: This rating specifies the non-repetitive peak current. This is only applied for an abnormal operation, which seldom occurs during the lifespan of the device. Tj: Derate this rating when using a device in order to ensure high reliability. We recommend that the device be used at a Tj of below 100°C. 3.0 1.4 Unit: mm 1.4 |
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