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ALD521DPD Datasheet(PDF) 3 Page - Advanced Linear Devices |
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ALD521DPD Datasheet(HTML) 3 Page - Advanced Linear Devices |
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3 / 6 page ![]() ALD512D Advanced Linear Devices 3 ABSOLUTE MAXIMUM RATINGS Supply voltage, V+ +7.0V Differential input voltage range -0.3V to V+ +0.3V Power dissipation 600 mW Operating temperature range PD, SD package 0 °C to +70°C Storage temperature range -65 °C to +150°C Lead temperature, 10 seconds +260 °C OPERATING ELECTRICAL CHARACTERISTICS TA = 25 oC V+ = +5V unless otherwise specified Parameter Symbol Min Typ Max Unit Test Conditions Supply Operating Voltage Range V+ 3 5 5.5 V Supply Current IDD 4.0 6.8 mA Input Characteristics Low Input Voltage VIL -0.3 1.0 V High Input Voltage VIH 3.5 5.3 V Input Leakage Current IIL -10 10 µA Output Characteristics Low Output Voltage VOL 0.2 0.8 V High Output Voltage VOH 3.6 4.8 V CL = 10pF. Rise/Fall Times tR , tF 25 125 nsec Oscillator (OSCIN, OSCOUT) Crystal Frequency fXTL 3.6864 4.0 MHz External Frequency (OSCIN) fOSC 4.0 MHz Timing Characteristics Power Up Delay Time tPU 36 msec Chip Select Setup Time1 tCS 1.1 µsec Chip Select Delay Time1 tCD 1 Conv. Cycle Data Valid Setup Time tDV 18 µsec Data Valid Time Out Time tTO 5.5 msec Data Out Time tDOUT 500 nsec Serial Clock Low Time tSC 11 25 µsec Data Not Valid Time tDNV 15 µsec Integration Time 2 tINT 16.666 300 msec Integrator ZERO Time tINTZ 2 msec Autozero Time tAZ tINT msec 1 Chip Select Delay time (tCD) may be as short as 7 µsec, if start of auto zero phase cycle time could be determined. For asynchoronous operation, tCD must be for a minimum of one complete conversion cycle to assure synchronization to start of auto zero phase cycle time. 2 These are typical practical limits for Integration time. Lower Integration time than the minimum allows more conversion cycles per second at reduced count resolution. Higher Integration time increases count resolution, but requires increased capacitor value and lowered number of conversion cycles per second. Deintegration time depends on selection of full scale input range, integration capacitor value and voltage reference. 3 ESD Sensitive Device. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to device and may affect device reliability. |
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