VCC

A

GND

Y

500 Ω

1 kΩ

B

4 kΩ

1.6 kΩ

130 Ω

1 kΩ

1.6 kΩ

2B

2A

1B

1A

4

5

3

GND

2Y

1Y

7

6

2

1

5

3

2B

2A

1B

1A

2Y

1Y

7

6

2

1

&

SN65472-EP

SLRS061 – SEPTEMBER 2013

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ORDERABLE PART NUMBER

TOP-SIDE MARKING

VID NUMBER

Tape of 75

SN65472DEP

65472

V62/13618-01XE-T

-40°C to 125°C

SOIC

− D

Reel of 2500

SN65472DREP

65472

V62/13618-01XE

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

website at www.ti.com.

(2)

Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.

LOGIC SYMBOL

LOGIC DIAGRAM (POSITIVE LOGIC)

This symbol is in accordance with

ANSI/IEEE Std 91-1984 and IEC

Publication 617-12.

Table 1. FUNCTION TABLE

(EACH DRIVER)

INPUTS

A

B

L

L

H (Off state)

L

H

H (Off state)

H

L

H (Off state)

H

H

L (On state)

(1)

positive logic: Y = AB or A + B

SCHEMATIC (EACH DRIVER)

Resistor values shown are nominal.

2

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