LMP91050

SNAS517D – NOVEMBER 2011 – REVISED MARCH 2013

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Operating Ratings

(1)

Supply Voltage

2.7V to 5.5V

Junction Temperature Range

(2)

-40°C to 105°C

Package Thermal Resitance,

10 Lead VSSOP

176 °C/W

(1)

“Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of

device reliability and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or

other conditions beyond those indicated in the Operating Ratings is not implied. Operating Ratings indicate conditions at which the

device is functional and the device should not be operated beyond such conditions.

(2)

Electrical Characteristics

(1)

Symbol

Parameter

Conditions

Units

Power Supply

VDD

Supply Voltage

2.7

3.3

5.5

V

IDD

Supply Current

All analog block ON

3.1

3.7

4.2

mA

Power Down Supply Current

All analog block OFF

45

85

121

μA

Offset Cancellation (Offset DAC)

Resolution

256

steps

LSB

All gains

33.8

mV

DNL

-1

2

LSB

Error

Output referred offset error, all gains

±100

mV

VDD –

Offset adjust Range

Output referred, all gains

0.2

V

0.2

DAC settling time

480

μs

IBIAS

Bias Current

5

200

pA

VINMAX

Max input signal High gain

Referenced to CMOUT voltage, it refers to the

±2

mV

_HGM

mode

maximum voltage at the IN pin before clipping; It

includes dark voltage of the thermopile and

VINMAX

Max input signal Low gain

±12

mV

signal voltage.

_LGM

mode

VOS

Input Offset Voltage

-165

µV

G _HGM

Gain High gain mode

250

V/V

G_LGM

Gain Low gain mode

42

V/V

GE

Gain Error

Both HGM and LGM

2.5

%

VDD –

VOUT

Output Voltage Range

0.5

0.5

V

1mV input step signal, HGM, Vout measured at

PhDly

Phase Delay

6

μs

Vdd/2

Phase Delay variation with

1mV input step signal, HGM, Vout measured at

TCPhDly

416

ns

Temperature

Vdd/2,

SSBW

Small Signal Bandwidth

Vin = 1mVpp, Gain = 250 V/V

18

kHz

Cin

Input Capacitance

100

pF

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

which the device may be permanently degraded, either mechanically or electrically.

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlations using

statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

4

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