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74LVC244APW Datasheet(PDF) 10 Page - NXP Semiconductors |
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74LVC244APW Datasheet(HTML) 10 Page - NXP Semiconductors |
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10 / 19 page ![]() 74LVC_LVCH244A All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved. Product data sheet Rev. 8 — 26 June 2013 10 of 19 NXP Semiconductors 74LVC244A; 74LVCH244A Octal buffer/line driver; 3-state Test data is given in Table 9. Definitions for test circuit: RL = Load resistance. CL = Load capacitance including jig and probe capacitance. RT = Termination resistance should be equal to output impedance Zo of the pulse generator. VEXT = External voltage for measuring switching times. Fig 8. Test circuit for measuring switching times VM VM tW tW 10 % 90 % 0 V VI VI negative pulse positive pulse 0 V VM VM 90 % 10 % tf tr tr tf 001aae331 VEXT VCC VI VO DUT CL RT RL RL G Table 9. Test data Supply voltage Input Load VEXT VI tr, tf CL RL tPLH, tPHL tPLZ, tPZL tPHZ, tPZH 1.2 V VCC 2ns 30pF 1 k open 2 V CC GND 1.65 V to 1.95 V VCC 2ns 30pF 1 k open 2 V CC GND 2.3 V to 2.7 V VCC 2ns 30pF 500 open 2 V CC GND 2.7V 2.7V 2.5 ns 50 pF 500 open 2 V CC GND 3.0Vto 3.6V 2.7V 2.5 ns 50 pF 500 open 2 V CC GND |
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