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AM29F400AT Datasheet(PDF) 34 Page - Advanced Micro Devices |
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AM29F400AT Datasheet(HTML) 34 Page - Advanced Micro Devices |
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34 / 35 page ![]() 34 Am29F400AT/Am29F400AB PRELIMINARY LATCHUP CHARACTERISTICS Includes all pins except VCC. Test conditions: VCC = 5.0 V, one pin at a time. TSOP PIN CAPACITANCE Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz. SO PIN CAPACITANCE Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz. DATA RETENTION Min Max Input Voltage with respect to VSS on all I/O pins –1.0 V VCC + 1.0 V VCC Current –100 mA +100 mA Parameter Symbol Parameter Description Test Setup Typ Max Unit CIN Input Capacitance VIN = 0 6 7.5 pF COUT Output Capacitance VOUT = 0 8.5 12 pF CIN2 Control Pin Capacitance VIN = 0 8 10 pF Parameter Symbol Parameter Description Test Setup Typ Max Unit CIN Input Capacitance VIN = 0 6 7.5 pF COUT Output Capacitance VOUT = 0 8.5 12 pF CIN2 Control Pin Capacitance VPP = 0 8 10 pF Parameter Test Conditions Min Unit Minimum Pattern Data Retention Time 150 °C 10 Years 125 °C 20 Years |
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