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STP15N80K5 Datasheet(PDF) 5 Page - STMicroelectronics

Part # STP15N80K5
Description  N-channel 800 V, 0.3 ohm typ., 14 A SuperMESH 5 Power MOSFET
PDF  22 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STP15N80K5 Datasheet(HTML) 5 Page - STMicroelectronics

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STB15N80K5, STF15N80K5, STP15N80K5, STW15N80K5
Electrical characteristics
Doc ID 023468 Rev 2
5/22
The built-in back-to-back Zener diodes have been specifically designed to enhance not only
the device’s ESD capability, but also to make them capable of safely absorbing any voltage
transients that may occasionally be applied from gate to source. In this respect, the Zener
voltage is appropriate to achieve efficient and cost-effective protection of device integrity.
The integrated Zener diodes thus eliminate the need for external components.
Table 6.
Switching times
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
td(on)
tr
td(off)
tf
Turn-on delay time
Rise time
Turn-off delay time
Fall time
VDD = 400 V, ID = 7 A,
RG=4.7 Ω, VGS=10 V
(see Figure 22)
-
19
17.6
44
10
-
ns
ns
ns
ns
Table 7.
Source drain diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
ISD
ISDM
Source-drain current
Source-drain current (pulsed)
-
14
56
A
A
VSD
(1)
1.
Pulsed: pulse duration = 300µs, duty cycle 1.5%
Forward on voltage
ISD= 14 A, VGS=0
-
1.5
V
trr
Qrr
IRRM
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD= 14 A, VDD= 60 V
di/dt = 100 A/µs,
(see Figure 21)
-
445
8.2
37
ns
μC
A
trr
Qrr
IRRM
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD= 14 A,VDD= 60 V
di/dt=100 A/µs,
Tj=150 °C
(see Figure 21)
-
580
10
35
ns
μC
A
Table 8.
Gate-source Zener diode
Symbol
Parameter
Test conditions
Min.
Typ.
Max
Unit
V(BR)GSO Gate-source breakdown voltage IGS= ± 1mA, ID= 0
30
-
-
V



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