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HSN2000 Datasheet(PDF) 1 Page - Maxwell Technologies |
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HSN2000 Datasheet(HTML) 1 Page - Maxwell Technologies |
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1 / 4 page ![]() 1 All data sheets are subject to change without notice (858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com Nuclear Event Detector HSN-2000 ©2005 Maxwell Technologies All rights reserved. 01.07.05 Rev 3 FEATURES: • Detects ionizing radiation pulses • Tested/certified detection threshold level • Adjustable circumvention period • 100% testable with built-in test • Detection threshold adjustability • Single +5V operation • Designed-in radiation hardness • Compliant to MIL-PRF-38534 Class H1 • Flat pack (F) or DIP (L) packages RADIATION HARDNESS CHARACTERISTICS • Dose Rate (operate-through): 1 x 1012 rad(Si)/sec • Total Dose: 1 x 106 rad(Si) • Neutron Fluence: 5 x 1013 n/cm2 • Approximate Detection Range: 2 x 105 - 2 x 107 rad(Si)/sec • Maxwell Technologies Specified, Controlled, and Tested DESCRIPTION: Maxwell Technologies’ HSN-2000 radiation-hardened Hybrid Nuclear Event Detector (NED) senses ionizing radiation pulses generated by a nuclear event, such as the detonation of a nuclear weapon, and rapidly switches its output from the normal high state to a low state with a propagation delay time of less than 20 ns. The active low Nuclear Event Detection signal (NED) is used to initiate a wide variety of circumvention functions, thus prevent- ing upset and burnout of electronic components. The NED output is also used to initiate both hardware and software recovery. This high-speed, 14-pin hybrid detector is used in electronic systems as a general-purpose circumvention device to protect memory, stop data processing, and drive power supply switches as well as signal clamps. The HSN-2000 is designed to operate through three critical envi- ronments: ionizing dose rate [1012 rad(Si)/s], gamma total dose [106 rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addition, the device is designed to function throughout the transient neutron pulse. The hybrid’s discrete design ensures a controlled response in these radiation environments as well as immunity to latchup. The detection level and functionality of a sample of each HSN- 2000 production lot are tested in an ionizing dose rate environ- ment. A certificate is provided reporting the test results for the production lot. The detection threshold of the HSN-2000 is adjustable within the range of 2 x 105 rad(Si)/s to 2 x 107 rad(Si)/s. This detection level can be preset by Maxwell or adjusted by the user. Less than a 30% variation in detection threshold can be expected over the entire operating temperature range. 1. Manufactured for Maxwell Technologies by Teledyne Microelectronic Technologies to MIL-PRF-38534, Class H, no RHA Logic Diagram Detector (Pin Diode) Amplifier Pulse Timer LED Logic Latch 12 4 5 7 6 8 9 14 1 2 13 11 V H V L Threshold Adjust V B BIT GND CRC Flag Reset Flag Reset NEF NED 10 k Ω 10 k Ω |
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