MMD Monitor/Quartztek

30400 Esperanza, Rancho Santa Margarita, CA, 92688

Sales@mmdcomp.com

05/31/11 B

Subject to change without notice

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Revision:

M

Marking Detail

Mechanical & Environmental Detail

Shock

MIL-STD-883, Method 2002 Cond B

Solderability

MIL-STD-883, Method 2003

Solvent Resistance

MIL-STD-202, Method 215

Vibration

MIL-STD-883, Method 2007, Cond A

Gross Leak Test

MIL-STD-883, Method 1014, Cond C

Fine Leak Test

MIL-STD-883, Method 1014, Cond A2

MSL

Level 1 per IPC/JEDEC J-STD 20

Frequency Range

1.000MHZ to 125.000MHZ

Frequency Stability (Inclusive of Temperature, Load

and Voltage)

See Part Number Guide

Aging @ 25°C

±5 ppm per year max

Operating Temperature Range

See Part Number Guide

Storage Temperature Range

-55°C to +125°C

Output Waveform

TTL

CMOS

Supply Voltage (Vdd)

+3.3 VDC

±10%

+5.0 VDC

±10%

+3.3 VDC

±10%

+5.0 VDC

±10%

Supply Current (unloaded)

25mA

45mA

25mA

45mA

Load

5TTL max

15pF max

Logic “0”

0.4V max

0.1 of Vdd max

Logic “1”

2.4V min

0.9 of Vdd min

Rise/Fall Time

4nSec max (0.4V to 2.4V)

4nSec max (20% Vdd to 80 Vdd)

Start Up Time

10mSec max

Duty Cycle

40%/60% (TTL @ 1.4V Level / CMOS @ 50% Waveform)

First Line = MXX.X (not to exceed 5 characters)

M

= MMD

XX.X

=

Device Frequency

(four digits including decimal

point)

Second Line = SYWW (not to exceed 5 charac-

ters)

S

= Internal Code

YYWW

= Date Code (Year/Week)

Y

= RoHS Compliant