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REF102 Datasheet(PDF) 3 Page - Burr-Brown (TI) |
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REF102 Datasheet(HTML) 3 Page - Burr-Brown (TI) |
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3 / 9 page ![]() REF102 ® 3 TEMPERATURE MAX INITIAL MAX DRIFT PRODUCT PACKAGE RANGE ERROR (mV) (ppm/ °C) REF102AU 8-Pin SOIC –25 °C to +85°C ±10 ±10 REF102AP 8-Pin Plastic DIP –25 °C to +85°C ±10 ±10 REF102BP 8-Pin Plastic DIP –25 °C to +85°C ±5 ±5 REF102AM Metal TO-99 –25 °C to +85°C ±10 ±10 REF102BM Metal TO-99 –25 °C to +85°C ±5 ±5 REF102CM Metal TO-99 –25 °C to +85°C ±2.5 ±2.5 REF102RM Metal TO-99 –55 °C to +125°C ±10 ±10 REF102SM Metal TO-99 –55 °C to +125°C ±5 ±5 ORDERING INFORMATION PIN CONFIGURATIONS Top View DIP/SOIC 8 7 1 4 5 3 26 Common Trim V OUT NC NC NC Noise Reduction 8 7 6 5 1 2 3 4 Noise Reduction NC V OUT Trim NC V+ Com NC V+ Top View TO-99 Input Voltage ...................................................................................... +40V Operating Temperature P,U .................................................................................. –25 °C to +85°C M ................................................................................... –55 °C to +125°C Storage Temperature Range P,U .................................................................................. –40 °C to +85°C M ................................................................................... –65 °C to +150°C Lead Temperature (soldering, 10s) ................................................ +300 °C (SOIC, 3s) ....................................................... +260 °C Short-Circuit Protection to Common or V+ ............................... Continuous ABSOLUTE MAXIMUM RATINGS PACKAGE INFORMATION PACKAGE DRAWING PRODUCT PACKAGE NUMBER(1) REF102AU 8-Pin SOIC 182 REF102AP 8-Pin Plastic DIP 006 REF102BP 8-Pin Plastic DIP 006 REF102AM Metal-TO-99 001 REF102BM Metal-TO-99 001 REF102CM Metal-TO-99 001 REF102RM Metal-TO-99 001 REF102SM Metal-TO-99 001 NOTE: (1) For detailed drawing and dimension table, please see end of data sheet, or Appendix C of Burr-Brown IC Data Book. ELECTROSTATIC DISCHARGE SENSITIVITY This integrated circuit can be damaged by ESD. Burr-Brown recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |
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