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PCF8583 Datasheet(PDF) 24 Page - NXP Semiconductors |
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PCF8583 Datasheet(HTML) 24 Page - NXP Semiconductors |
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24 / 37 page ![]() PCF8583 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 06 — 6 October 2010 24 of 37 NXP Semiconductors PCF8583 Clock and calendar with 240 x 8-bit RAM 11. Application information 11.1 Quartz frequency adjustment 11.1.1 Method 1: Fixed OSCI capacitor By evaluating the average capacitance necessary for the application layout, a fixed capacitor can be used. The frequency is measured using the 1 Hz signal available after power-on at the interrupt output (pin 7). The frequency tolerance depends on the quartz crystal tolerance, the capacitor tolerance and the device-to-device tolerance. Average deviations of ±5 minutes per year are possible. 11.1.2 Method 2: OSCI trimmer Using the alarm function (via the I2C-bus) a signal faster than the 1 Hz is generated at the interrupt output for fast setting of a trimmer. Procedure: • Power the device on • Initialize the device (alarm functions). Routine: • Set clock to time t and set alarm to time t + Δt • at time t + Δt (interrupt) repeat routine. 11.1.3 Method 3: Direct measurement Direct measurement of oscillator output (allowing for test probe capacitance). |
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