CAT28C16A

4

Doc. No. 25033-00 2/98

Figure 1. A.C. Testing Input/Output Waveform(3)

5089 FHD F03

Figure 2. A.C. Testing Load Circuit (example)

5089 FHD F04

Note:

(1) This parameter is tested initially and after a design or process change that affects the parameter.

(2) Output floating (High-Z) is defined as the state when the external data line is no longer driven by the output buffer.

(3) Input rise and fall times (10% and 90%) < 10 ns.

INPUT PULSE LEVELS

REFERENCE POINTS

2.0 V

0.8 V

2.4 V

0.45 V

1.3V

DEVICE

UNDER

TEST

1N914

3.3K

CL = 100 pF

OUT

CL INCLUDES JIG CAPACITANCE

A.C. CHARACTERISTICS, Read Cycle

±10%, unless otherwise specified.

28C16A-20

Symbol

Parameter

Min.

Max.

Units

Read Cycle Time

200

ns

CE Access Time

200

ns

Address Access Time

200

ns

OE Access Time

80

ns

CE Low to Active Output

0

ns

OE Low to Active Output

0

ns

CE High to High-Z Output

55

ns

OE High to High-Z Output

55

ns

Output Hold from Address Change

0

ns