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SSD50N10 Datasheet(PDF) 2 Page - SeCoS Halbleitertechnologie GmbH

Part # SSD50N10
Description  N-Ch Enhancement Mode Power MOSFET
PDF  4 Pages
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Manufacturer  SECOS [SeCoS Halbleitertechnologie GmbH]
Direct Link  http://www.secosgmbh.com
Logo SECOS - SeCoS Halbleitertechnologie GmbH

SSD50N10 Datasheet(HTML) 2 Page - SeCoS Halbleitertechnologie GmbH

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Elektronische Bauelemente
SSD50N10
50A , 100V , RDS(ON) 22mΩ
N-Ch Enhancement Mode Power MOSFET
19-Oct-2012 Rev. A
Page 2 of 4
http://www.SeCoSGmbH.com/
Any changes of specification will not be informed individually.
ELECTRICAL CHARACTERISTICS (TJ=25°C unless otherwise specified)
Parameter
Symbol
Min.
Typ.
Max.
Unit
Teat Conditions
Static
Drain-Source Breakdown Voltage
BVDSS
100
-
-
V
VGS=0, ID= 250μA
Gate-Threshold Voltage
VGS(th)
2.5
-
4.5
V
VDS=VGS, ID=250μA
Gate-Source Leakage Current
IGSS
-
-
±100
nA
VGS= ±20V
TJ=25°C
-
-
1
VDS=80V, VGS=0
Drain-Source Leakage Current
TJ=55°C
IDSS
-
-
5
μA
VDS=80V, VGS=0
Static Drain-Source On-Resistance
2
RDS(ON)
-
18
22
mΩ
VGS=10V, ID=30A
Total Gate Charge
2
Qg
-
27.6
-
Gate-Source Charge
Qgs
-
11.4
-
Gate-Drain (“Miller”) Change
Qgd
-
7.9
-
nC
ID=30A
VDS=80V
VGS=10V
Turn-on Delay Time
2
Td(on)
-
15.6
-
Rise Time
Tr
-
17.2
-
Turn-off Delay Time
Td(off)
-
16.8
-
Fall Time
Tf
-
9.2
-
nS
VDS=50V
ID=30A
VGS=10V
RL=3.3 Ω
Input Capacitance
Ciss
-
1890
-
Output Capacitance
Coss
-
268
-
Reverse Transfer Capacitance
Crss
-
67
-
pF
VGS =0
VDS=15V
f =1.0MHz
Gate Resistance
Rg
1.9
3.8
Ω
f=1MHz
Guaranteed Avalanche Characteristics
Single Pulse Avalanche Energy
5
EAS
53
-
-
mJ
VDD=25V, L=0.1mH, IAS=30A
Source-Drain Diode
Diode Forward Voltage
2
VSD
-
-
1.2
V
IS=1A, VGS=0, TJ=25°C
Continuous Source Current
1,6
IS
-
-
45
A
Pulsed Source Current
2,6
ISM
-
-
100
A
VD=VG=0, Force Current
Reverse Recovery Time
Trr
-
34
-
nS
Reverse Recovery Charge
Qrr
-
47
-
nC
IF=30A, dI/dt=100A/µs ,
TJ=25°C
Notes:
1. The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
2. The data tested by pulsed , pulse width ≦ 300μs , duty cycle ≦ 2%
3. The EAS data shows Max. rating . The test condition is VDD=25V,VGS=10V,L=0.1mH,IAS=41A
4. The power dissipation is limited by 150°C, junction temperature
5. The Min. value is 100% EAS tested guarantee.
6. The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation.



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