EL2072C

730 MHz Closed Loop Buffer

A

e

25 C)

g

7V

Output Current

Output is short-circuit protect-

ed to ground however maxi-

mum reliability is obtained if

Input Voltage

g

Operating Temperature

b

Junction Temperature

175 C

Storage Temperature

b

Thermal Resistance

Note See EL2071EL2171 for Thermal Impedance curves

Important Note

All parameters having MinMax specifications are guaranteed The Test Level column indicates the specific device testing actually

performed during production and Quality inspection Elantec performs most electrical tests using modern high-speed automatic test

Test Level

Test Procedure

I

100% production tested and QA sample tested per QA test plan QCX0002

II

III

QA sample tested per QA test plan QCX0002

IV

Parameter is guaranteed (but not tested) by Design and Characterization Data

V

DC Electrical Characteristics

Parameter

Description

Test

Temp

Min

Typ

Max

Test

Units

Conditions

Level

Output Offset Voltage

25 C

20

80

I

mV

160

V

mV

130

V

mV

Average Offset

200

500

IV

mV C

Voltage Drift

200

1000

Input Bias Current

100

500

II

mA

1000

V

mA

Average Input Bias

2000

3000

IV

nA C

Current Drift

2000

7000

Small Signal Gain

25 C

096

098

I

VV

095

V

VV

ILIN

Integral End

g

2V FS

25 C

02

04

IV

%FS

Point linearity

08

IV

%FS

03

IV

%FS

PSRR

Power Supply

All

450

650

II

dB

Rejection Ratio

Supply CurrentQuiescent

No Load

All

150

200

II

mA

2