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C2955 Datasheet(PDF) 2 Page - Hamamatsu Corporation |
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C2955 Datasheet(HTML) 2 Page - Hamamatsu Corporation |
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2 / 2 page ![]() SPECIFICATIONS q Infrared CCD Camera (camera head, camera control unit) Imaging device .............................................. 2/3-inch infrared CCD Spectral response ......................................... 400 nm to 1200 nm No. of pixels .................................................. 380,000 Effective photocathode size ......................... 6.3 × 4.7 mm Power consumption ..................................... 20 VA q Video Monitor CRT ............................................................... 12-inch/Black and white, high-resolution model Resolution (horizontal center) ...................... 900 TV lines min. Power consumption ..................................... 38 VA q Infrared Microscope Optical path switching .................................. 100 : 0 / 0 : 100 (eyepiece/camera) Stage travel area .......................................... 153 × 153 mm Epi-illuminated light source .......................... 12 V, 100 W halogen lamp Revolver ........................................................ 5 holes Infrared objectives ........................................ 10 ×, 20 ×, 50 × (optional: 5 ×, 100 × 1) q Environmental Conditions Ambient operating temperature range ......... 0 to +40°C Ambient storage temperature range ............ -10 to +50°C Ambient operating/storage humidity ............ 90% max. (with no condensation) Line voltage ................................................... 100 VAC ± 10%, 50/60 Hz COMPONENTS • Infrared CCD camera • Camera control unit • Video monitor • Infrared microscope (including light source dimmer transformer*) • Cables: 1 set * Specify the line voltage at ordering. APPLICATIONS • Inspection of flip-chip and other packaged IC devices • Testing for abnormalities (defects, failures) in metal and polysilicon wiring • Observation of wire bonding • Observation of various types of die bonding zones • Simultaneous inspection of Al-Si nodules and multiple patterns • Observation of pattern diffusion into substrate • Identification of ESD failure locations • Subject to local technical requirements and regulations, availability of products included in this promotional material may vary. Please consult with our sales office. • Information furnished by HAMAMATSU is believed to be reliable. However, no responsibility is assumed for possible inaccuracies or omissions. Specifications and external appearance are subject to change without notice. © 1999 Hamamatsu Photonics K.K. OPTIONS • C7103 IC Backside Polishing System IMAGE EXAMPLE ISO 9001/ISO 13485 EN 46001 Certificate: 09 105 79045 Homepage Address http://www.hamamatsu.com HAMAMATSU PHOTONICS K.K., Systems Division 812 Joko-cho, Hamamatsu City, 431-3196, Japan, Telephone: (81)53-431-0124, Fax: (81)53-435-1574, E-mail:export@sys.hpk.co.jp U.S.A. and Canada: Hamamatsu Photonic Systems: 360 Foothill Road, Bridgewater, N.J. 08807-0910, U.S.A., Telephone: (1)908-231-1116, Fax: (1)908-231-0852 Germany: Hamamatsu Photonics Deutschland GmbH: Arzbergerstr. 10, D-82211 Herrsching am Ammersee, Germany, Telephone: (49)8152-375-0, Fax: (49)8152-2658 France: Hamamatsu Photonics France S.A.R.L.: 8, Rue du Saule Trapu, Parc du Moulin de Massy, 91882 Massy Cedex, France, Telephone: (33)1 69 53 71 00, Fax: (33)1 69 53 71 10 United Kingdom: Hamamatsu Photonics UK Limited: Lough Point, 2 Gladbeck Way, Windmill Hill, Enfield, Middlesex EN2 7JA, United Kingdom, Telephone: (44)208-367-3560, Fax: (44)208-367-6384 North Europe: Hamamatsu Photonics Norden AB: Smidesvägen 12, SE-171-41 Solna, Sweden, Telephone: (46)8-509-031-00, Fax: (46)8-509-031-01 Italy: Hamamatsu Photonics Italia S.R.L.: Strada della Moia, 1/E 20020 Arese (Milano), Italy, Telephone: (39)02-935 81 733, Fax: (39)02-935 81 741 Cat. No. SSIS 1025E02 JUL/99 CR Created in Japan (PDF) |
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