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Specifications HCS11MS

Absolute Maximum Ratings

Reliability Information

Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V

Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V

DC Input Current, Any One Input

. . . . . . . . . . . . . . . . . . . . . . . .±10mA

DC Drain Current, Any One Output

. . . . . . . . . . . . . . . . . . . . . . .±25mA

(All Voltage Reference to the VSS Terminal)

ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1

Thermal Impedance . . . . . . . . . . . . . . . .

θ

ja

θ

jc

Weld Seal DIC . . . . . . . . . . . . . . . . . . .

Weld Seal Flat Pack . . . . . . . . . . . . . .

Power Dissipation per Package (PD)

CAUTION: As with all semiconductors, stress listed under “Absolute Maximum Ratings” may be applied to devices (one at a time) without resulting in permanent

damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed

under “Electrical Performance Characteristics” are the only conditions recommended for satisfactory device operation..

Operating Conditions

Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V

Input Rise and Fall Times at 4.5V VCC (TR, TF) . . . . . 100ns/V Max

Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . 0.0V to 30% of VCC

Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . 70% of VCC to VCC

TABLE 1. DC. ELECTRICAL PERFORMANCE CHARACTERISTICS

PARAMETERS

SYMBOL

(NOTE 1)

CONDITIONS

GROUP

A SUB-

GROUPS

TEMPERATURE

LIMITS

UNITS

MIN

MAX

Quiescent Current

ICC

VCC = 5.5V,

VIN = VCC or GND

1

10

µA

2, 3

-

200

µA

Output Current

(Sink)

IOL

VCC = 4.5V, VIH = 4.5V,

VOUT = 0.4V, VIL = 0V

1

4.8

-

mA

2, 3

4.0

-

mA

Output Current

(Source)

IOH

VCC = 4.5V, VIH = 4.5V,

VOUT = VCC -0.4V,

VIL = 0V

1

-4.8

-

mA

2, 3

-4.0

-

mA

Output Voltage Low

VOL

VCC = 4.5V, VIH = 3.15V,

IOL = 50

µA, VIL = 1.35V

1, 2, 3

-

0.1

V

VCC = 5.5V, VIH = 3.85V,

IOL = 50

µA, VIL = 1.65V

1, 2, 3

-

0.1

V

Output Voltage High

VOH

VCC = 4.5V, VIH = 3.15V,

IOH = -50

µA, VIL = 1.35V

1, 2, 3

VCC

-0.1

-V

VCC = 5.5V, VIH = 3.85V,

IOH = -50

µA, VIL = 1.65V

1, 2, 3

VCC

-0.1

-V

Input Leakage

Current

IIN

VCC = 5.5V, VIN = VCC or

GND

1

±0.5

µA

2, 3

±5.0

µA

Noise Immunity

Functional Test

FN

VCC = 4.5V,

VIH = 0.70(VCC),

VIL = 0.30(VCC) (Note 2)

7, 8A, 8B

---

NOTE:

1. All voltages reference to device GND.

2. For functional tests VO

≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.