TN0985 datasheet(13/32 Pages) STMICROELECTRONICS

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TN0985

Procedure

2.3

Radiation

The radiation guarantee depends on the product series:

•

M54HCMOS series: each wafer is tested to a total dose of 50 krad according to the

ESCC 22900. The corresponding radiation verification test (RVT) report is included in

the documentation provided with each shipment.

•

CMOS4000B series: each wafer lot is tested to a total dose of 100 krad according to

the ST internal specification. The corresponding RVT report is included in the

documentation provided with each shipment.

2.4

Marking

The devices are marked as follows (see also Figure 3):

•

Date code/ST logo/country of origin (e.g. FR = France)

•

ESCC detailed specification number + specific variant as shown in Table 7.

Table 6. Parameter drift values

Characteristic

Symbols

Limits

Units

Drift value

Absolute

Min.

Max.

Threshold voltage

N-channel

VTHn

±0.4

-0.7

-3

Threshold voltage

P-channel

VTHp

0.7

Table 7. Variant table

Package

Gold finish

Hot solder dipped

Flat

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