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AN2266 Datasheet(PDF) 13 Page - STMicroelectronics |
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AN2266 Datasheet(HTML) 13 Page - STMicroelectronics |
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13 / 16 page ![]() DocID11830 Rev 2 13/16 AN2266 Long line protection 16 The LCP02-150B1 and the PTC still continue to operate properly after the test in accordance with the K20 A criterion. Figure 19. LCP02-150B1 behavior during 230 Vrms, 10 Ω, 15 min. metallic (on TIP) power contact Figure 19 shows the voltage across the TIP pin of LCP02-150B1, the gate voltages and current through the LCP02-150B1 when subjected to 230 Vrms, through 10 Ω, for 15 min. - ITU-T K20 power contact test. For power contact tests, the PTC heats up and the LCP02-150B1 behaves like the LCP1521S in the negative domain. That is, from the moment that the negative gate current becomes lower than the negative gate triggering current of the LCP02-150B1, this device does not fire anymore, but only clamps. It still fires in the positive domain because its positive gate is highly sensitive. The voltage trip at the TIP pin is between both battery voltages ±65 V. The LCP02-150B1 and the PTC still continue to operate properly after the test in accordance with K20 A criterion, while this test with 10 Ω requires only the K20 B criterion. I surge: 5A /div V Tip: 20V/div +Vb: 20V/div 0 -Vbat: 20V/div |
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