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AN2266 Datasheet(PDF) 13 Page - STMicroelectronics

Part # AN2266
Description  SLIC based system protection for European and Asian markets
PDF  16 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

AN2266 Datasheet(HTML) 13 Page - STMicroelectronics

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DocID11830 Rev 2
13/16
AN2266
Long line protection
16
The LCP02-150B1 and the PTC still continue to operate properly after the test in
accordance with the K20 A criterion.
Figure 19. LCP02-150B1 behavior during 230 Vrms, 10 Ω, 15 min. metallic (on TIP)
power contact
Figure 19 shows the voltage across the TIP pin of LCP02-150B1, the gate voltages and
current through the LCP02-150B1 when subjected to 230 Vrms, through 10 Ω, for 15 min. -
ITU-T K20 power contact test. For power contact tests, the PTC heats up and the
LCP02-150B1 behaves like the LCP1521S in the negative domain. That is, from the
moment that the negative gate current becomes lower than the negative gate triggering
current of the LCP02-150B1, this device does not fire anymore, but only clamps. It still fires
in the positive domain because its positive gate is highly sensitive. The voltage trip at the
TIP pin is between both battery voltages ±65 V.
The LCP02-150B1 and the PTC still continue to operate properly after the test in
accordance with K20 A criterion, while this test with 10
Ω requires only the K20 B criterion.
I surge: 5A /div
V Tip: 20V/div
+Vb: 20V/div
0
-Vbat: 20V/div



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