| Electronic Components Datasheet Search |
|
GAL6002 Datasheet(PDF) 13 Page - Lattice Semiconductor |
|
|
|||||||||||||||||||||||||||||
GAL6002 Datasheet(HTML) 13 Page - Lattice Semiconductor |
|
13 / 16 page ![]() Specifications GAL6002 13 Array Description The GAL6002 contains two E2 reprogrammable arrays. The first is an AND array and the second is an OR array. These arrays are de- scribed in detail below. AND ARRAY The AND array is organized as 78 inputs by 75 product term outputs. The 10 ILMCs, 10 IOLMCs, 8 BLMC feedbacks, 10 OLMC feed- backs, and ICLK comprise the 39 inputs to this array (each available in true and complement forms). 64 product terms serve as inputs to the OR array. The RESET product term generates the RESET signal described in the Output and Buried Logic Macrocells sec- tion. There are 10 output enable product terms which allow device I/O pins to be bi-directional or tri-state. OR ARRAY The OR array is organized as 64 inputs by 36 sum term outputs. 64 product terms from the AND array serve as the inputs to the OR array. Of the 36 sum term outputs, 18 are data (“D”) terms and 18 are enable/clock (“E”) terms. These terms feed into the 10 OLMCs and 8 BLMCs, one “D” term and one “E” term to each. The programmable OR array offers unparalleled versatility in prod- uct term usage. This programmability allows from 1 to 64 product terms to be connected to a single sum term. A programmable OR array is more flexible than a fixed, shared, or variable product term architecture. Electronic Signature An electronic signature is provided with every GAL6002 device. It contains 72 bits of reprogrammable memory that can contain user defined data. Some uses include user ID codes, revision numbers, or inventory control. The signature data is always available to the user independent of the state of the security cell. NOTE: The electronic signature is included in checksum calcula- tions. Changing the electronic signature will alter the checksum. Security Cell A security cell is provided with every GAL6002 device as a deterrent to unauthorized copying of the array patterns. Once programmed, this cell prevents further read access to the AND array. This cell can be erased only during a bulk erase cycle, so the original con- figuration can never be examined once this cell is programmed. The Electronic Signature is always available to the user, regard- less of the state of this control cell. Device Programming GAL devices are programmed using a Lattice Semiconductor- approved Logic Programmer, available from a number of manufac- turers. Complete programming of the device takes only a few seconds. Erasing of the device is transparent to the user, and is done automatically as part of the programming cycle. Typical Input Pull-up Characteristic 1. 0 2 . 0 3. 0 4 . 0 5. 0 -6 0 0 -2 0 -4 0 0 Input V o lt ag e ( V olt s) Register Preload When testing state machine designs, all possible states and state transitions must be verified, not just those required during normal operations. This is because certain events may occur during sys- tem operation that cause the logic to be in an illegal state (power- up, line voltage glitches, brown-out, etc.). To test a design for proper treatment of these conditions, a method must be provided to break the feedback paths and force any desired state (i.e., illegal) into the registers. Then the machine can be sequenced and the outputs tested for correct next state generation. All of the registers in the GAL6002 can be preloaded, including the ILMC, IOLMC, OLMC, and BLMC registers. In addition, the con- tents of the state and output registers can be examined in a special diagnostics mode. Programming hardware takes care of all preload timing and voltage requirements. Latch-Up Protection GAL6002 devices are designed with an on-board charge pump to negatively bias the substrate. The negative bias is of sufficient magnitude to prevent input undershoots from causing the circuitry to latch. Additionally, outputs are designed with n-channel pull-ups instead of the traditional p-channel pull-ups to eliminate any pos- sibility of SCR induced latching. Input Buffers GAL6002 devices are designed with TTL level compatible input buffers. These buffers have a characteristically high impedance, and present a much lighter load to the driving logic than bipolar TTL devices. GAL6002 input buffers have active pull-ups within their input struc- ture. This pull-up will cause any un-terminated input or I/O to float to a TTL high (logical 1). Lattice Semiconductor recommends that all unused inputs and tri-stated I/O pins be connected to another active input, Vcc, or GND. Doing this will tend to improve noise immunity and reduce Icc for the device. |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |