3

RH1013M

SYMBOL PARAMETER

CONDITIONS

NOTES MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX

MIN

MAX UNITS

Input Ofset Voltage

450

450

600

750

900

µV

2

600

600

750

900

µV

Input Offset Current

10

10

15

20

25

nA

210

10

15

20

nA

Input Bias Current

60

75

100

175

250

nA

2

80

100

125

200

nA

Input Voltage Range

1

13.5

13.5

13.5

13.5

13.5

V

1

–15.0

–15.0

– 15.0

– 15.0

–15.0

V

2

3.5

3.5

3.5

3.5

V

20

0

0

0

V

CMRR

97

97

94

90

86

dB

Ratio

PSRR

Power Supply Rejection

100

98

94

86

80

dB

Ratio

500

200

100

50

25

V/mV

Maximum Output Voltage

±12.5

±12.5

±12.5

±12.5

±12.5

V

Swing

Output Low, No Load

2

25

30

40

50

mV

Output Low, 600 to GND

2

10

10

10

10

mV

2

0.6

0.8

1.0

1.6

V

Output High, No Load

2

4.0

4.0

4.0

4.0

V

Output High, 600 to GND

2

3.4

3.2

3.0

2.8

V

SR

Slew Rate

0.13

0.12

0.11

0.07

0.01

V/µs

Supply Current

Per Amplifier

0.55

0.55

0.55

0.55

0.55

mA

2

0.50

0.50

0.50

0.50

mA

10KRAD(Si)

20KRAD(Si)

50KRAD(Si)

100KRAD(Si)

200KRAD(Si)

MIL-STD-883 TEST REQUIREMENTS

SUBGROUP

Final Electrical Test Requirements (Method 5004)

1*,2,3,4,5,6

Group A Test Requirements (Method 5005)

1,2,3,4,5,6

Group B and D for Class S, and

1,2,3

Group C and D for Class B

End Point Electrical Parameters (Method 5005)

* PDA applies to subgroup 1. See PDA Test Notes.

TABLE 2: ELECTRICAL TEST REQUIRE E TS

PDA Test Notes

The PDA is specified as 5% based on failures from group A, subgroup 1,

tests after cooldown as the final electrical test in accordance with method

5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after

burn-in divided by the total number of devices submitted for burn-in in

that lot shall be used to determine the percent for the lot.

Linear Technology Corporation reserves the right to test to tighter limits

than those given.

Note 1: Guaranteed by design, characterization, or correlation to other

tested parameters..