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RH117 Datasheet(PDF) 3 Page - Linear Technology |
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RH117 Datasheet(HTML) 3 Page - Linear Technology |
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3 / 4 page ![]() 3 RH117 SYMBOL PARAMETER CONDITIONS NOTES MIN MAX MIN MAX MIN MAX MIN MAX UNITS IADJ Adjust Pin Current 100 100 100 100 µA I ADJ Adjust Pin Current 10mA I OUT I MAX 55 5 5 µA Change 2.5V (V IN – VOUT ) 40V, 5 5 5 5 µA IOUT = 10mA IMIN Minimum Load (VIN – VOUT ) = 40V 5 5 5 5 mA Current Current Limit (VIN – VOUT ) 15V H Package 0.5 0.5 0.5 0.5 A K Package 1.5 1.5 1.5 1.5 A (VIN – VOUT ) = 40V H Package 0.15 0.15 0.15 0.15 A K Package 0.30 0.30 0.30 0.30 A 100KRAD(Si) 50KRAD(Si) 20KRAD(Si) 10KRAD(Si) TABLE 1A: ELECTRICAL CHARACTERISTICS (Postirradiation) (Note 5) Note 1: Unless otherwise specified, these specifications apply for VIN – VOUT = 5V; and IOUT = 0.1A for the H package (TO-39) and IOUT = 0.5A for the K package (TO-3) package. Although power dissipation is internally limited, these specifications are applicable for power dissipations of 2W for the TO-39 and 20W for the TO-3. IMAX is 0.5A for the TO-39 and 1.5A for the TO-3. Note 2: Regulation is measured at a constant junction temperature using pulse testing with a low duty cycle. Changes in output voltage due to heating effects are covered under the specification for thermal regulation. Note 3: Guaranteed by design, characterization or correlation to other tested parameters. Note 4: TJ = 25°C unless otherwise noted. Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen- tation that the interconnection of its circuits as described herein will not infringe on existing patent rights. TOTAL DOSE BIAS CIRCUIT MIL-STD-883 TEST REQUIREMENTS SUBGROUP Final Electrical Test Requirements (Method 5004) 1*,2,3 Group A Test Requirements (Method 5005) 1,2,3 Group C and D End Point Electrical Parameters 1 (Method 5005) * PDA Applies to subgroup 1. See PDA Test Notes. PDA Test Notes The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup 1, after burn-in divided by the total number of devices submitted for burn- in in that lot shall be used to determine the percent for the lot. Linear Technology Corporation reserves the right to test to tighter limits than those given. TABLE 2: ELECTRICAL TEST REQUIRE E TS RH117 VIN 2k 61.9 Ω 0.1 µF ADJ –15V RH117 TA01 OUTPUT 15V |
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