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RH137 Datasheet(PDF) 3 Page - Linear Technology |
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RH137 Datasheet(HTML) 3 Page - Linear Technology |
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3 / 4 page ![]() 3 RH137 Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen- tation that the interconnection of its circuits as described herein will not infringe on existing patent rights. 50KRAD(Si) 20KRAD(Si) 10KRAD(Si) 100KRAD(Si) 200KRAD(Si) SYMBOL PARAMETER CONDITIONS NOTES MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS IADJ Adjust Pin Current 100 100 100 100 100 µA I ADJ Adjust Pin Current Change 10mA I OUT I MAX 55 5 5 5 µA 3V VIN – VOUT= 40V 5 5 5 5 5 µA IMIN Minimum Load Current VIN – VOUT= 40V 5 5 5 5 5 mA VIN – VOUT 10V 3 3 3 3 3 mA Current Limit H Package VIN – VOUT 15V 0.5 1.5 0.5 1.5 0.5 1.5 0.5 1.5 0.5 1.5 A VIN – VOUT= 40V 0.15 0.5 0.15 0.5 0.15 0.5 0.15 0.5 0.15 0.5 A K Package VIN – VOUT 15V 1.5 3.2 1.5 3.2 1.5 3.2 1.5 3.2 1.5 3.2 A VIN – VOUT= 40V 0.24 1 0.24 1 0.24 1 0.24 1 0.24 1 A TABLE 1A: ELECTRICAL CHARACTERISTICS (Postirradiation) (Note 4) Note 1: Unless otherwise specified, these specifications apply for VIN – VOUT= 5V; and IOUT = 0.1A for the H package (TO-39) and IOUT = 0.5A for the K package (TO-3) package. Although power dissipation is internally limited, these specifications are applicable for power dissipations of 2W for the TO-39 and 20W for the TO-3. IMAX is 0.2A for the TO-39 and 1.5A for the TO-3 package. Note 2: Regulation is measured at a constant junction temperature using pulse testing with a low duty cycle. Changes in output voltage due to heating effects are covered under the specification for thermal regulation. Note 3: Guaranteed by design, characterization or correlation to other tested parameters. Note 4: TJ = 25°C unless otherwise noted. MIL-STD-883 TEST REQUIREMENTS SUBGROUP Final Electrical Test Requirements (Method 5004) 1*,2,3 Group A Test Requirements (Method 5005) 1,2,3 Group C and D End Point Electrical Parameters 1 (Method 5005) * PDA Applies to subgroup 1. See PDA Test Notes. PDA Test Notes The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup 1, after burn-in divided by the total number of devices submitted for burn- in in that lot shall be used to determine the percent for the lot. Linear Technology Corporation reserves the right to test to tighter limits than those given. TABLE 2: ELECTRICAL TEST REQUIRE E TS TOTAL DOSE BIAS CIRCUIT RH137 VIN 243 Ω 2k 2 1 ADJ –15V RH137 TDBC OUTPUT CASE |
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