66348 datasheet(2/3 Pages) MICROPAC

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MICROPAC INDUSTRIES, INC. OPTOELECTRONIC PRODUCTS DIVISION  725 E. Walnut Street, Garland, TX 75040  (972) 272-3571  Fax (972) 487-6918

www.micropac.com

E-MAIL: OPTOSALES @ MICROPAC.COM

66348

15 kV HIGH VOLTAGE, 6N134 TYPE HIGH SPEED ISOLATOR

04/03/2013

ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified)

PARAMETER

SYMBOL

MIN

TYP

MAX

UNITS

TEST CONDITIONS

NOTE

Input LED

Input Forward Voltage

1.3

1.6

IF = 20 mA

Reverse Current

100

µA

VR = 3.0 V

Output IC

High Level Output Current

IOH

0.25

µA

VCC = 5.25 V, VOH = 5.25 V,

IF = 0 mA, CL = 0.1 F

Low Level Output Voltage

VOL

0.40

0.5

VCC = 4.5 V, IF = 10 mA

IOL (Sinking) = 8.0 mA,

CL = 0.1 F

High Level Supply Current

ICCH

2.5

VCC = 5.25V, IF = 0 mA

Low Level Supply Current

ICCL

VCC = 5.25 V, IF = 10 mA

Coupled Characteristics (VCC = 5 V)

Coupling Capacitance

CI—O

2.0

Input and Output leads shorted

Propagation Delay Time To High Output Level

tPLH

100

VCC = 5 V, RL = 560 ,

IF = 10 mA, CL = 0.1 F

Propagation Delay Time To Low Output Level

tPHL

200

VCC = 5 V, RL = 560 ,

IF = 10 mA, CL = 0.1 F

Difference in Propagation Delays

tPHL - tPLH

100

Input – Output Isolation Voltage

VI-O

15,000

II-O = 25 A

LED Positive going Threshold Current

-001

IF+

0.9

5.0

VCC = 5.0 V, IOL = 8.0 mA

CL = 0.1 F

-002

4.0

15.0

dV/dt Withstand (LED is OFF)

CMH

5.0

kV/

s

VCC = 5.0 V, IF = 0 mA,

400 V

VCM  1000 V,

VO(MIN) = 2.0 V, t = 1 s

Fig. 1

dV/dt Withstand (LED is ON)

-001

CML

-5.0

kV/

s

VCC = 5.0 V, IF = 5.0 mA,

400 V

 VCM  1000 V,

VO(MAX) = 0.8 V, t = 1 s

Fig. 1

-002

-5.0

VCC = 5.0 V, IF = 15.0 mA,

400 V

 VCM  1000 V,

VO(MAX) = 0.8 V, t = 1 s

Fig. 1

NOTES:

1) The duration can be extended to 10 seconds maximum when flow soldering. Otherwise 5 seconds with soldering iron.

2) Device considered a two terminal device with all Input pins (Anode and Cathode) shorted together and all Output pins (VCC, GND and Output) shorted together.

3) These tests are not performed 100% in production. Tests are run on an evaluation sample of isolators built with each unique sensor wafer lot. Wafer lots that

pass evaluation are certified for use in production fabrication of isolators.

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