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TC835 Datasheet(PDF) 7 Page - Microchip Technology

Part # TC835
Description  Personal Computer Data Acquisition A/D Converter
PDF  24 Pages
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Manufacturer  MICROCHIP [Microchip Technology]
Direct Link  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

TC835 Datasheet(HTML) 7 Page - Microchip Technology

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© 2002 Microchip Technology Inc.
DS21478B-page 7
TC835
3.0
DETAILED DESCRIPTION
(All Pin Designations Refer to 28-Pin DIP)
3.1
Dual Slope Conversion Principles
The TC835 is a dual slope, integrating analog to digital
converter. An understanding of the dual slope conver-
sion technique will aid in following the detailed TC835
operational theory.
The conventional dual slope converter measurement
cycle has two distinct phases:
1.
Input signal integration
2.
Reference voltage integration (de-integration)
The input signal being converted is integrated for a fixed
time period, with time being measured by counting clock
pulses. An opposite polarity constant reference voltage
is then integrated until the integrator output voltage
returns to zero. The reference integration time is directly
proportional to the input signal.
In
a
simple
dual
slope
converter,
a
complete
conversion requires the integrator output to "ramp-up"
and "ramp-down."
A simple mathematical equation relates the input sig-
nal, reference voltage and integration time:
EQUATION 3-1:
For a constant VIN:
EQUATION 3-2:
The dual slope converter accuracy is unrelated to the
integrating resistor and capacitor values, as long as
they are stable during a measurement cycle. An
inherent benefit is noise immunity. Noise spikes are
integrated, or averaged, to zero during the integration
periods. Integrating ADCs are immune to the large
conversion errors that plague successive approxima-
tion converters in high noise environments (see
Figure 3-1).
FIGURE 3-1:
BASIC DUAL SLOPE
CONVERTER
3.2
TC835
Operational Theory
The TC835 incorporates a system zero phase and
integrator output voltage zero phase to the normal two
phase dual slope measurement cycle. Reduced sys-
tem errors, fewer calibration steps and a shorter over-
range recovery time result.
The TC835 measurement cycle contains four phases:
1.
System zero
2.
Analog input signal integration
3.
Reference voltage integration
4.
Integrator output zero
Internal analog gate status for each phase is shown in
Table 3-1.
3.2.1
SYSTEM ZERO
During this phase, errors due to buffer, integrator and
comparator offset voltages are compensated for by
charging CAZ (auto zero capacitor) with a compensat-
ing error voltage. With a zero input voltage the
integrator output will remain at zero.
The external input signal is disconnected from the inter-
nal circuitry by opening the two SWI switches. The
internal input points connect to ANALOG COMMON.
The reference capacitor charges to the reference
voltage potential through SWR. A feedback loop,
closed around the integrator and comparator, charges
the CAZ capacitor with a voltage to compensate for
buffer amplifier, integrator and comparator offset
voltages (see Figure 3-2).
1
RINTCINT
TINT
0
VIN(T)DT =
VREF TDEINT
RINTCINT
where:
VREF
= Reference voltage
TINT
= Signal integration time (fixed)
TDEINT = Reference voltage integration time
(variable).
VIN =
VREF TDEINT
tINT
REF
Voltage
Analog Input
Signal
Display
Switch
Drive
Control
Logic
Clock
Counter
Polarity Control
Phase
Control
VIN ≈ VREF
Variable
Reference
Integrate
Time
Fixed
Signal
Integrate
Time
Integrator
Comparator
VIN ≈ 1/2 VREF



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