KAI−1003

www.onsemi.com

9

DEFECT SPECIFICATIONS

Defect Test Conditions

Temperature:

40

°C

Integration Time:

33 ms (20 MHz HCCD Frequency, No Binning, 30 fps Frame Rate)

Light Source:

Continuous Green Light Centered at 550 nm

Operation:

Nominal Voltages and Timing

Table 7. DEFECT DEFINITIONS

Name

Maximum

Number

Definition

Major Defective Pixel

20

A pixel whose signal deviates by more than 25 mV from the mean value of all active pixels

under dark field condition or by more than 8% from the mean value of all active pixels

Minor Defective Pixel

100

A pixel whose signal deviates by more than 8 mV from the mean value of all active pixels

under dark field condition.

Cluster Defect

4

A group of 2 to 6 contiguous major defective pixels, but no more than 2 adjacent defects

horizontally.

Column Defect

0

A group of more than 6 contiguous major defective pixels along a single column.

Defect Proximity

Minimum Distance between Defective Clusters:

2 Pixels in All Directions without Major Pixel Defects

Minimum Distance between Defective Columns:

3 Columns without Column Defects or Cluster Defects