VP5311B/VP5511B

2

66.83

1.050

27k

1.3699

24.93

50

33.75

17.64

1.40

7.62

7.62

0.40

34.15

18.71

26.73

8.02

8.02

0.00

ELECTRICAL CHARACTERISTICS

Test conditions (unless otherwise stated): As specified in Recommended Operating Conditions

DC CHARACTERISTICS

VIN

VIL

VIH

VIL

IIH

IIL

VOH

VOL

VOL

2.0

0.7 VDD

3.7

0.8

0.3 VDD

10

-10

0.4

0.6

V

V

V

V

µA

µA

V

V

V

Parameter

Conditions

VIN = VDD

VIN = VSS

IOH = -1mA

IOL = +4mA

IOL = +6mA

Symbol

Min.

Typ.

Max.

Units

ELECTRICAL CHARACTERISTICS

Test conditions (unless otherwise stated): As specified in Recommended Operating Conditions

DC CHARACTERISTICS DACs

INL

DNL

±1.5

±1

±5

LSB

LSB

%

µA

V

Ω

mA

pV-s

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

mA

Parameter

Symbol

Min.

Typ.

Max.

Units

Accuracy (each DAC)

Integral linearity error

Diffential linearity error

DAC matching error

Monotonicity

LSB size

Internal reference voltage

Internal reference voltage output impedance

Ω

Peak Glitch Energy (see fig.3)

CVBS, Y and C - NTSC (pedestal enabled)

Maximum output, relative to sync bottom

White level relative to black level

Black level relative to blank level

Blank level relative to sync level

Colour burst peak - peak

DC offset (bottom sync)

CVBS, Y and C - PAL

Maximum output

White level relative to black level

White level relative to sync level

Black level relative to sync level

Colour burst peak - peak

DC offset (bottom sync)

Digital Inputs TTL compatible (except SDA, SCL)

Input high voltage

Input low voltage

Digital Inputs SDA, SCL

Input high voltage

Input low voltage

Input high current

Input low current

Digital Outputs CMOS compatible

Output high voltage

Output low voltage

Digital Output SDA

Output low voltage

guaranteed

ABSOLUTE MAXIMUM RATINGS

Supply voltage

VDD, AVDD

-0·3 to 7·0V

Voltage on any non power pin

-0·3 to VDD+0·3V

Ambient operating temperature

0 to 70

°C

Storage temperature

-55

°C to 150°C

Note: Stresses exceeding these listed under Absolute

Maximum Ratings may induce failure. Exposure to Absolute

Maximum Ratings for extended periods may reduce

reliability. Functionality at or above these conditions is not

implied.