If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales Office/

Distributors for availability and specifications.

Above which the useful life may be impaired

Storage Temperature

−65˚C to +150˚C

Maximum Junction Temperature (T

Ceramic

+175˚C

Case Temperature under Bias (T

–55˚C to +125˚C

V

−7.0V to +0.5V

Input Voltage (DC)

V

Output Current (DC Output HIGH)

−50 mA

Operating Range (Note 2)

−5.7V to −4.2V

ESD (Note 3)

≥2000V

Recommended Operating

Conditions

Case Temperature (T

Military

−55˚C to +125˚C

Supply Voltage (V

−5.7V to −4.2V

Note 2: Absolute maximum ratings are those values beyond which the de-

vice may be damaged or have its useful life impaired. Functional operation

under these conditions is not implied.

Note 3: ESD testing conforms to MIL-STD-883, Method 3015.

Military Version

DC Electrical Characteristics

V

Symbol

Parameter

Min

Typ

Max

Units

T

C

Conditions

Notes

V

OH

Output HIGH

−1025

−870

mV

0˚C to

V

or V

IL(Min)

Loading with

50

Ω to −2.0V

(Notes

4, 5, 6)

Voltage

+125˚C

−1085

−870

mV

−55˚C

V

OL

Output LOW

−1830

−1620

mV

0˚C to

Voltage

+125˚C

−1830

−1555

mV

−55˚C

V

OHC

Output HIGH

−1035

mV

0˚C to

V

or V

IL(Max)

Loading with

50

Ω to −2.0V

Voltage

+125˚C

−1085

mV

−55˚C

(Notes

4, 5, 6)

V

OLC

Output LOW

−1610

mV

0˚C to

Voltage

+125˚C

−1555

mV

−55˚C

DC Electrical Characteristics

V

Symbol

Parameter

Min

Typ

Max

Units

T

C

Conditions

Notes

V

DIFF

Input Voltage

150

mV

−55˚C to

Required for Full

(Notes 4, 5,

6)

Differential

+125˚C

Output Swing

V

CM

Common Mode

V

V

V

−55˚C to

(Notes 4, 5,

6)

Voltage

+125˚C

V

IH

Single-Ended

−1165

−870

mV

−55˚C to

Guaranteed HIGH Signal

(Notes 4, 5,

6, 7)

Input High Voltage

+125˚C

for All Inputs

V

IL

Single-Ended

−1830

−1475

mV

−55˚C to

Guaranteed LOW Signal

(Notes 4, 5,

6, 7)

Input Low Voltage

+125˚C

for All Inputs

I

IH

Input HIGH Current

150

µA

−55˚C to

V

(Notes 4, 5,

6)

CLKIN, CLKIN

+125˚C

TCLK

450

µA

CLKSEL

380

µA

I

CBO

Input Leakage

−10

µA

−55˚C to

V

(Notes 4, 5,

6)

Current

+125˚C

I

EE

Power Supply

−80

−25

mA

−55˚C to

(Notes 4, 5,

6)

Current, Normal

+125˚C

Note 4: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately

without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case

condition at cold temperatures.

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