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100314F Datasheet(PDF) 4 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # 100314F
Description  Low Power Quint Differential Line Receiver
PDF  8 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

100314F Datasheet(HTML) 4 Page - National Semiconductor (TI)

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AC Electrical Characteristics
V
EE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
T
C =
−55˚C
T
C =
+25˚C
T
C =
+125˚C
Units
Conditions
Notes
Min
Max
Min
Max
Min
Max
t
PLH
Propagation Delay
0.40
2.30
0.60
2.20
0.60
2.70
ns
(Notes 7, 8, 9)
t
PHL
Data to Output
Figures 1, 2
t
TLH
Transition Time
0.20
1.40
0.20
1.40
0.20
1.40
ns
(Note 10)
t
THL
20% to 80%,80% to 20%
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
Note 10: Not tested at +25˚C, +125˚C and −55˚C temperature (design characterization data).
Test Circuit
DS100299-5
Note: VCC,VCCA = +2V, VEE = −2.5V
L1 and L2 = equal length 50
Ω impedance lines
RT = 50Ω terminator internal to scope
Decoupling 0.1 µF from GND to VCC and VEE
All unused outputs are loaded with 50
Ω to GND
CL = Fixture and stray capacitance ≤ 3pF
FIGURE 1. AC Test Circuit
www.national.com
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