V

Symbol

Parameter

T

T

T

Units

Conditions

Notes

Min

Max

Min

Max

Min

Max

t

s

Setup Time

D

0.60

0.60

0.60

ns

S

n

1.70

1.60

2.40

Figure 4

(Note 10)

t

h

Hold Time

D

0.90

0.90

0.90

ns

S

n

0.50

0.50

0.50

t

Pulse Width HIGH

2.00

2.00

2.00

ns

Figure 3

CP

Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately

after power-up. This provides “cold start” specifications which can be considered a worst case condition at cold temperatures.

Note 8: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.

Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.

Note 10: Not tested at +25˚C, +125˚C and −55˚C temperature (design characterization data).

Note 11: The propagation delay specified is for the switching of a single output. Delays may vary up to 0.40 ns if multiple outputs are switching simultaneously.

Test Circuitry

DS100315-6

Notes:

L1, L2 and L3 = equal length 50

Ω impedance lines

All unused outputs are loaded with 50

Ω to GND

Pin numbers shown are for Flatpak; for DIP see logic symbol

FIGURE 1. AC Test Circuit

5

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