Z86L88/81/86/87/89/73

IR/Low-Voltage Microcontroller

DS96LV00800

P R E L I M I N A R Y

9

1

ABSOLUTE MAXIMUM RATINGS

Stresses greater than those listed under Absolute Maxi-

mum Ratings may cause permanent damage to the de-

vice. This is a stress rating only; operation of the device at

any condition above those indicated in the operational sec-

tions of these specifications is not implied. Exposure to ab-

solute maximum rating conditions for an extended period

may affect device reliability.

STANDARD TEST CONDITIONS

The characteristics listed below apply for standard test

conditions as noted. All voltages are referenced to GND.

Positive current flows into the referenced pin (Figure 8).

CAPACITANCE

Symbol

Description

Min

Max

Units

Supply Voltage

(*)

–0.3

+7.0

V

Storage Temp.

–65

°

+150

°

C

Oper. Ambient

Temp.

†C

Notes: :

* Voltage on all pins with respect to GND.

† See Ordering Information.

Figure 8. Test Load Diagram

From Output

Under Test

150 pF

I

Parameter

Max

Input capacitance

12 pF

Output capacitance

12 pF

I/O capacitance

12 pF