4

Z86E03/E06

CP95DZ81301

PRELIMINARY

ABSOLUTE MAXIMUM RATINGS

Symbol

Description

Min

Max

Units

V

CC

Supply Voltage*

–0.3

+7.0

V

V

IN

Input Voltage**

–0.3

V

V

T

STG

Storage Temp

–65

+150

C

T

A

Oper Ambient Temp

†

C

Stress greater than those listed under Absolute Maximum

Ratings may cause permanent damage to the device. This

is a stress rating only; operation of the device at any

condition above those indicated in the operational sec-

tions of these specifications is not implied. Exposure to

absolute maximum rating conditions for extended period

may affect device reliability.

Notes:

* Voltage on Vcc with respect to Vss.

† See Ordering Information

** Voltages on all pins with respect to Vss without current limitations.

STANDARD TEST CONDITIONS

The characteristics listed below apply for standard test

conditions as noted. All voltages are referenced to ground.

Positive current flows into the referenced pin (Test Load

Configuration).

Test Load Configuration

GENERAL DESCRIPTION (Continued)

18-Pin SOIC

Pin Configuration

150 pF

1

18

P24

P27

Vcc

XTAL2

XTAL1

P31

P32

P23

P22

P21

P20

GND

P36

P35

P34

P33

Z86E03/E06

SOIC

P25

P26

2

3

4

5

6

7

8

9

17

16

15

14

13

12

10

11