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STW50N65DM2AG Datasheet(PDF) 5 Page - STMicroelectronics |
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STW50N65DM2AG Datasheet(HTML) 5 Page - STMicroelectronics |
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5 / 12 page ![]() STW50N65DM2AG Electrical characteristics DocID028101 Rev 1 5/12 Table 8: Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 38 A ISDM(1) Source-drain current (pulsed) - 152 A VSD(2) Forward on voltage VGS = 0 V, ISD = 38 A - 1.6 V trr Reverse recovery time ISD = 38 A, di/dt = 100 A/µs, VDD = 60 V (see Figure 16: "Test circuit for inductive load switching and diode recovery times") - 150 ns Qrr Reverse recovery charge - 0.96 µC IRRM Reverse recovery current - 12.8 A trr Reverse recovery time ISD = 38 A, di/dt = 100 A/µs, VDD = 60 V, Tj = 150 °C (see Figure 16: "Test circuit for inductive load switching and diode recovery times") - 245 ns Qrr Reverse recovery charge - 2.7 µC IRRM Reverse recovery current - 22 A Notes: (1) Pulse width is limited by safe operating area. (2) Pulse test: pulse duration = 300 µs, duty cycle 1.5%. |
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