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LM747QML Datasheet(PDF) 2 Page - Texas Instruments |
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LM747QML Datasheet(HTML) 2 Page - Texas Instruments |
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2 / 10 page ![]() LM747QML SNOSAR6A – DECEMBER 2010 – REVISED MARCH 2013 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Absolute Maximum Ratings (1) Supply voltage ±22V Power Dissipation(2) 800mW Differential Input Voltage ±30V Input Voltage(3) ±15V Output Short-Circuit Duration Indefinite Maximum Junction Temperature (TJmax) 150°C Operating Temperature Range −55°C ≤ TA ≤ +125°C Storage Temperature Range −65°C ≤ TA ≤ +150°C Lead Temperature (Soldering, 10 seconds) +300°C (1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. (2) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower. (3) For supply voltages less than ±15V, the absolute maximum input voltage is equal to the supply voltage. Quality Conformance Inspection Mil-Std-883, Method 5005 - Group A Subgroup Description Temp (°C) 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 12 Settling time at +25 13 Settling time at +125 14 Settling time at -55 2 Submit Documentation Feedback Copyright © 2010–2013, Texas Instruments Incorporated Product Folder Links: LM747QML |
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