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LM747QML Datasheet(PDF) 2 Page - Texas Instruments

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Part # LM747QML
Description  LM747QML Dual Operational Amplifier
PDF  10 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

LM747QML Datasheet(HTML) 2 Page - Texas Instruments

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LM747QML
SNOSAR6A – DECEMBER 2010 – REVISED MARCH 2013
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
Absolute Maximum Ratings
(1)
Supply voltage
±22V
Power Dissipation(2)
800mW
Differential Input Voltage
±30V
Input Voltage(3)
±15V
Output Short-Circuit Duration
Indefinite
Maximum Junction Temperature (TJmax)
150°C
Operating Temperature Range
−55°C ≤ TA ≤ +125°C
Storage Temperature Range
−65°C ≤ TA ≤ +150°C
Lead Temperature (Soldering, 10 seconds)
+300°C
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2)
The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature),
θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any
temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower.
(3)
For supply voltages less than ±15V, the absolute maximum input voltage is equal to the supply voltage.
Quality Conformance Inspection
Mil-Std-883, Method 5005 - Group A
Subgroup
Description
Temp (°C)
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
12
Settling time at
+25
13
Settling time at
+125
14
Settling time at
-55
2
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Copyright © 2010–2013, Texas Instruments Incorporated
Product Folder Links: LM747QML



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