DS1776 datasheet(3/11 Pages) NSC

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DC Electrical Characteristics (Continued)

CC = 5V ±10% (Unless Otherwise Specified) DC testing temp. groups: 1 = +25˚C, 2 = +125˚C, 3 = −55˚C

Symbol

Parameter

Conditions

Temp.

Min

Typ

Max Units

(Notes 3, 5)

Group

(Note 4)

Voltage

Except An

CC=Min, II=−18 mA

−1.2

IH2

Input Current

OEBn, OEA,

CC=Min, VI=7.0V

1, 2, 3

100

µA

at Max

CC=Min, VI=5.5V

0.01

Input Voltage

CC=Min, VI=5.5V

0.01

IH1

Input Current

OEB, OEA, LE

CC=Max, VI=2.7V

µA

at Max

B0–B7

CC=Max, VI=2.1V

100

µA

Input Voltage

Low Level

OEB, OEA, LE

CC=Max, VI=0.5V

2, 3

−40

µA

Input Current

−20

µA

CC=Max, VI=0.3V

1, 2, 3

−100

µA

OZH

TRI-STATE

CC=Max, VO=2.7V

1, 2, 3

Output Current,

µA

High Level

Voltage Applied

OZH

TRI-STATE

CC=Max, VO=0.5V

1, 2, 3

Output Current,

−70

µA

Low Level

Voltage Applied

High Level

CC=Max, VX=VCC,

1,2,3

Control Current

LE=OEA=OEBn=2.7V

−100

100

µA

An=2.7V, Bn=2.0V

CC=Max, VX=3.14V &

3.47V,

1, 2, 3

LE=OEA=OEBn=2.7V,

−10

An=2.7V, Bn=2.0V

Short-Circuit

CC=Max, Bn=1.9V,

1, 2, 3

Output Current

OEA=2.0V,

OEBn=2.7V

−60

−75

−150

(Note 6)

Supply Current

CCH

CC=Max, VIH

(A)=5.0V

1, 2

CCH

341

CCL

CC=Max, VIL(A)=0.3V

1, 2, 3

CCZ

CC=Max, VIL(A)=0.3V

1, 2, 3

OFF

Power Off

Bn=2.1V, V

CC=0.0V,

1, 2, 3

100

µA

Output Current

IL=Max or VIH=Min

Note 1: Absolute Maximum Ratings are those values beyond which damage to the device may occur.

Note 2: Unless otherwise specified all voltages are referenced to ground.

Note 3: For conditions shown as Min or Max, use the appropriate value specified under recommended operating conditions. Unless otherwise specified, VX = VCC

for all test conditions.

Note 4: All typical values are at VCC = 5V, TA = 25˚C.

Note 5: Due to test equipment limitations, actual test conditions are for VIH = 1.9V and for VIL = 1.2V, however the specified test limits and conditions are guaranteed.

Note 6: Not more than one output should be shorted at a time. For testing [<i]nfOS the use of high speed test apparatus and/or sample-and-hold techniques are

preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip tem-

perature above normal and thereby cause invalid readings in other parameter tests. In any squence of parameter test [<i]nfOStest should be performed last.

Note 7: Not more than one output should be shorted at a time. For testing IOS, the use of high speed test apparatus and/or sample-and-hold techniques are pref-

erable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip tem-

perature above normal and thereby cause invalid readings in other parameter tests. In any squence of parameter test, IOS tests should be performed last.

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