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DS26C31TM Datasheet(PDF) 4 Page - National Semiconductor (TI) |
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DS26C31TM Datasheet(HTML) 4 Page - National Semiconductor (TI) |
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4 / 12 page ![]() Comparison Table of Switching Characteristics into “LS-Type” Load (Continued) V CC = 5V, TA = 25˚C, tr ≤ 6 ns, tf ≤ 6ns(Figures 2, 4, 5, 6) (Note 12) Symbol Parameter Conditions DS26C31T DS26LS31C Units Typ Max Typ Max t THL,tTLH Differential Output Rise C L = 30 pF and Fall Times S1 Closed 4 6 ns S2 Closed t PLZ Output Disable Time C L = 10 pF (Note 10) S1 Closed 6 9 15 35 ns S2 Open t PHZ Output Disable Time C L = 10 pF (Note 10) S1 Open 4 7 15 25 ns S2 Closed t PZL Output Enable Time C L = 30 pF S1 Closed 14 20 20 30 ns S2 Open t PZH Output Enable Time C L = 30 pF S1 Open 11 17 20 30 ns S2 Closed Note 12: This table is provided for comparison purposes only. The values in this table for the DS26C31 reflect the performance of the device but are not tested or guaranteed. Note 13: ESD Rating: HBM (1.5 k Ω, 100 pF) Inputs ≥ 1500V Outputs ≥ 1000V EIAJ (0 Ω, 200 pF) ≥ 350V Logic Diagram AC Test Circuit and Switching Time Waveforms DS008574-2 DS008574-3 Note: C1 = C2 = C3 = 40 pF (Including Probe and Jig Capacitance), R1 = R2 = 50 Ω,R3 = 500Ω. FIGURE 1. AC Test Circuit www.national.com 4 |
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