Page 9

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Formosa MS

Document ID

Issued Date

Revised Date

Revision

Page.

FMBTA55 / FMBTA56

Driver Transistor

DS-231164

2010/11/05

2011/07/21

B

9

High reliability test capabilities

1.

2.

3.

4.

5.

6.

7.

8.

Steady State Operating Life

High Temperature Reverse Bias

Temperature Cycle

Autoclave

High Temperature Storage Life

Solderability

High Temperature High Humidity Reverse

Bias

Resistance to Soldering Heat

TA=25°C P =225mW Test Duration:1000hrs

D

Tj= 150℃, V = 80% related volage,

1000hrs

CE

-55℃(15min) to 150℃(15min)Air to Air Transition Time<20sec Test Cycles:1000cycle

P= 2atm Ta= 121℃ RH= 100% Test Duration: 96hrs

Ta= 150℃ Test Duration: 1000hrs

245℃,Test Duration: 5sec

Ta= 85℃, 85% RH, V = 80% related volage, Test Duration: 1000hrs

CE

260℃

Test Duration:

Item Test

Conditions