5

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Group D

Sample 5005

1, 2, 3, 8A, 8B, 9

Subgroups 1, 2 3

NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9, Deltas

Table 4

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1

(Note 1)

1, 2, 4, 5, 8, 9, 11,

12

3, 6, 7, 10, 13

14

Static Burn-In 2

(Note 1)

1, 2, 4, 5, 8, 9, 11,

12

7

3, 6, 10, 13, 14

Dynamic Burn-

In (Note 2)

-

7

14

1, 2, 4, 5, 8, 9, 11,

12

3, 6, 10, 13

Irradiation

(Note 3)

1, 2, 4, 5, 8, 9, 11,

12

7

3, 6, 10, 13, 14

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

± 5%, VDD = 18V ± 0.5V

2. Each pin except VDD and GND will have a series resistor of 4.75K

± 5%; VDD = 18V ± 0.5V

3. Each pin except VDD and GND will have a series resistor of 47K

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD = 10V ±

0.5V

TABLE 6. APPLICABLE SUBGROUPS (Continued)

CONFORMANCE GROUP

MIL-STD-883

METHOD

GROUP A SUBGROUPS

READ AND RECORD

Typical Performance Characteristics

FIGURE 2. TYPICAL OUTPUT LOW (SINK) CURRENT

CHARACTERISTICS

FIGURE 3. MINIMUM LOW (SINK) CURRENT CHARACTERIS-

TICS

10V

5V

GATE-TO-SOURCE VOLTAGE (VGS) = 15V

0

20

10

30

40

50

DRAIN-TO-SOURCE VOLTAGE (VDS) (V)

1

2

345

67

8

60

70

GATE-TO-SOURCE VOLTAGE (VGS) = 15V

5V

10V

0

20

10

30

40

50

DRAIN-TO-SOURCE VOLTAGE (VDS) (V)

1

2

345

67

8

60

70

CD4041UBMS