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LM2437T Datasheet(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # LM2437T
Description  Monolithic Triple 7.5 ns CRT Driver
PDF  10 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM2437T Datasheet(HTML) 2 Page - National Semiconductor (TI)

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Absolute Maximum Ratings (Notes 1, 3)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (V
CC)
+90V
Bias Voltage (V
BB)
+16V
Input Voltage (V
IN)
0Vto6V
Storage Temperature Range (T
STG)
−65˚C to +150˚C
Lead Temperature
(Soldering, <10 sec.)
300˚C
ESD Tolerance, Human Body Model
2 kV
Machine Model
250V
Operating Ranges (Note 2)
V
CC
+60V to +85V
V
BB
+8V to +15V
V
IN
+0V to +5V
V
OUT
+15V to +75V
Case Temperature
−20˚C to +100˚C
Do not operate the part without a heat sink.
Electrical Characteristics
(See
Figure 2 for Test Circuit)
Unless otherwise noted: V
CC = +80V, VBB = +12V, VIN = +2.7 VDC,CL = 8 pF, Output = 40 VPP at 1 MHz, TC = 50˚C.
Symbol
Parameter
Conditions
LM2437
Units
Min
Typical
Max
I
CC
Supply Current
All Three Channels, No Input Signal,
No Output Load
34.5
mA
I
BB
Bias Current
All Three Channels
11
mA
V
OUT
DC Output Voltage
No AC Input Signal, V
IN = 1.2V
62
65
68
V
DC
A
V
DC Voltage Gain
No AC Input Signal
−12
−14
−16
∆A
V
Gain Matching
(Note 4), No AC Input Signal
1.0
dB
LE
Linearity Error
(Notes 4, 5), No AC Input Signal
8
%
t
R
Rise Time
(Note 6), 10% to 90%
7.5
ns
t
F
Fall Time
(Note 6), 90% to 10%
7.5
ns
OS
Overshoot
(Note 6)
5
%
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.
Note 2: Operating ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and
test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may
change when the device is not operated under the listed test conditions.
Note 3: All voltages are measured with respect to GND, unless otherwise specified.
Note 4: Calculated value from Voltage Gain test on each channel.
Note 5: Linearity Error is the variation in dc gain from VIN = 1.0V to VIN = 4.5V.
Note 6: Input from signal generator: tr,tf < 1 ns.
AC Test Circuit
Figure 2 shows a typical test circuit for evaluation of the LM2437. This circuit is designed to allow testing of the LM2437 in a 50
environment without the use of an expensive FET probe. The two 2490
Ω resistors form a 200:1 divider with the 50Ω resistor and
the oscilloscope. A test point is included for easy use of an oscilloscope probe.The compensation capacitor is used to compen-
sate the stray capacitance of the two 2490
Ω resistors to achieve flat frequency response.
DS100932-3
Note: 8 pF load includes parasitic capacitance.
FIGURE 2. Test Circuit (One Channel)
www.national.com
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