If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales Office/

Distributors for availability and specifications.

Supply Voltage, V

CC

+90V

Bias Voltage, V

BB

+16V

Input Voltage, V

IN

0V to 4.5V

Storage Temperature Range, T

STG

-65˚C to +150˚C

Lead Temperature (Soldering,

300˚C

ESD Tolerance, Human Body Model

2kV

V

CC

+60V to +85V

V

BB

+8V to 15V

V

IN

0V to +3.75V

V

OUT

+15V to +75V

Case Temperature

-20˚C to +100˚C

Do not operate the part without a heat sink.

Electrical Characteristics

(See Figure 3 for Test Circuit)

Unless otherwise noted: V

DC Tests: V

AC Tests: Output = 40V

Symbol

Spec Parameter

Conditions

Min

Typ

Max

Units

I

CC

Supply Current

Per Channel, No Input Signal, No

Output Load

812

mA

I

BB

Bias Current

All three Channels

15

25

mA

V

OUT

DC Output Voltage

No AC Input Signal, V

62

65

68

V

DC

A

V

DC Voltage Gain

No AC Input Signal

-18

-20

-22

∆A

V

Gain Matching

Note 4, No AC Input Signal

1.0

dB

LE

Linearity Error

Note 4, 5, No AC Input Signal

5

%

t

R

Rise Time

Note 6, 10% to 90%

9.5

nS

t

F

Fall Time

Note 6, 90% to 10%

10.5

nS

OS

Overshoot

Note 6

5

%

Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.

Note 2: Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and

the test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may

change when the device is not operated under the listed test conditions.

Note 3: All voltages are measured with respect to GND, unless otherwise specified.

Note 4: Calculated value from Voltage Gain test on each channel.

AC Test Circuit

DS200006-3

FIGURE 3. Test Circuit (One Channel)

www.national.com

2