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CCN Series Issue October 2009 Sheet

Environmental Data

Test Per MIL-PRF-914

MIL-PRF-914 Limits (ΔR%)

TaNFilm® Test Data (ΔR%)

M

K

H

V

Max

Typical

Thermal Shock and Power Conditioning

0.7

0.7

0.5

0.25

0.1

0.02

Low Temperature Operation

0.5

0.25

0.1

0.1

0.05

0.02

Short Term Overload

0.5

0.25

0.1

0.1

0.05

0.02

Resistance to Bonding Exposure

0.25

0.25

0.25

0.25

0.1

0.02

Steady State Humidity

0.5

0.5

0.5

0.2

0.1

0.03

Moisture Resistance

0.5

0.5

0.4

0.25

0.1

0.03

Shock

0.25

0.25

0.25

0.25

0.1

0.03

Vibration

0.25

0.25

0.25

0.25

0.1

0.03

Life

2.0

0.5

0.5

0.5

0.1

0.03

High Temperature Exposure

1.0

0.5

0.2

0.1

0.1

0.03

Low Temperature Storage

0.5

0.25

0.1

0.1

0.05

0.01

Schematic Data

Resistor Network

9

10

11

12

13

18

17

16

15

14

4

5

6

7

8

3

2

1

20

19

9

10

11

12

13

18

17

16

15

14

4

5

6

7

8

3

2

1

20 19

9

10

11

12

13

18

17

16

15

14

4

5

6

7

8

3

2

1

20

19

9

10

11

12

13

18

17

16

15

14

4

5

6

7

8

3

2

1

20 19

R3

R2

R1

R19

R4

R5

R6

R7

R8

R18

R17

R16

R15

R14

R9

R10

R11

R12

R13

R3

R2

R1

R19

R1

R4

R3

R5

R6

R7

R9

R8

R2

R10

R1

R2

R3

R6

R5

R4

R9

R10

R8

R7

R1

R2

R3

R4

R5

R6

R9

R8

R10

R7

7800/7900

7807/7907

7808/7908

7809/7909

Resistor Network

CCN Series

Make Possible

07.14

General Note

TT Electronics reserves the right to make changes in product specification without notice or liability.

All information is subject to TT Electronics’ own data and is considered accurate at time of going to print.

© TT Electronics plc

www.ttelectronicsresistors.com