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LMC6001AIH Datasheet(PDF) 1 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # LMC6001AIH
Description  Ultra Ultra-Low Input Current Amplifier
PDF  14 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

LMC6001AIH Datasheet(HTML) 1 Page - National Semiconductor (TI)

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LMC6001
Ultra Ultra-Low Input Current Amplifier
General Description
Featuring 100% tested input currents of 25 fA max., low op-
erating power, and ESD protection of 2000V, the LMC6001
achieves a new industry benchmark for low input current op-
erational amplifiers. By tightly controlling the molding com-
pound, National is able to offer this ultra-low input current in
a lower cost molded package.
To avoid long turn-on settling times common in other low in-
put current opamps, the LMC6001A is tested 3 times in the
first minute of operation. Even units that meet the 25 fA limit
are rejected if they drift.
Because of the ultra-low input current noise of 0.13 fA/
√Hz,
the LMC6001 can provide almost noiseless amplification of
high resistance signal sources. Adding only 1 dB at 100 k
Ω,
0.1 dB at 1 M
Ω and 0.01 dB or less from 10 MΩ to 2,000 MΩ,
the LMC6001 is an almost noiseless amplifier.
The LMC6001 is ideally suited for electrometer applications
requiring ultra-low input leakage such as sensitive photode-
tection transimpedance amplifiers and sensor amplifiers.
Since input referred noise is only 22 nV/
√Hz, the LMC6001
can achieve higher signal to noise ratio than JFET input type
electrometer amplifiers. Other applications of the LMC6001
include long interval integrators, ultra-high input impedance
instrumentation amplifiers, and sensitive electrical-field mea-
surement circuits.
Features
(Max limit, 25˚C unless otherwise noted)
n Input current (100% tested):
25 fA
n Input current over temp.:
2 pA
n Low power:
750 µA
n Low VOS:
350 µV
n Low noise:
22 nV/
√Hz @1 kHz Typ.
Applications
n Electrometer amplifier
n Photodiode preamplifier
n Ion detector
n A.T.E. leakage testing
Connection Diagrams
8-Pin DIP
DS011887-1
Top View
8-Pin Metal Can
DS011887-2
Top View
March 1995
© 1999 National Semiconductor Corporation
DS011887
www.national.com


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