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MM58274CV Datasheet(PDF) 9 Page - National Semiconductor (TI) |
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MM58274CV Datasheet(HTML) 9 Page - National Semiconductor (TI) |
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9 / 16 page ![]() Functional Description (Continued) Both of the flags and the interrupt output are reset by the trailing edge of the read strobe The flag information is held latched during a control register read guaranteeing that sta- ble status information will always be read out by the proces- sor Interrupt timeout is detected and stored internally if it occurs during a read of the control register the interrupt output will then go low only after the read has been completed A clock setting pulse occurring during a control register read will not affect the data-changed flag since time data read out before or after the control read will not be affected by the time change METHODS OF DEVICE OPERATION Test Mode National Semiconductor uses test mode for functionally testing the MM58274C after fabrication and again after packaging Test mode can also be used to set up the oscil- lator frequency when the part is first commissioned Figure 4 shows the internal clock connections when the de- vice is written into test mode The 32768 kHz oscillator is gated onto the interrupt output to provide a buffered output for initial frequency setting This signal is driven from a TRI-STATE output buffer enabling easy oscillator setting in systems where interrupt is not normally used and there is no external resistor on the pin If an interrupt is programmed the 32768 kHz output is switched off to allow high speed testing of the interrupt tim- er The interrupt output will then function as normal The clock startstop bit can be used to control the fast clocking of the time registers as shown in Figure 4 Initialization When it is first installed and power is applied the device will need to be properly initialized The following operation steps are recommended when the device is set up (all numbers are decimal) 1) Disable interrupt on the processor to allow oscillator set- ting Write 1510 into the control register The clock and inter- rupt startstop bits are set to 1 ensuring that the clock and interrupt timers are both halted Test mode and the interrupt register are selected 2) Write 0 to the interrupt register Ensure that there are no interrupts programmed and that the oscillator will be gated onto the interrupt output 3) Set oscillator frequency All timing has been halted and the oscillator is buffered out onto the interrupt line 4) Write 5 to the control register The clock is now out of test mode but is still halted The clock setting register is now selected by the interrupt select bit 5) Write 0001 to all registers This ensures starting with a valid BCD value in each register 6) Set 1224 Hours Mode Write to the clock setting register to select the hours counting mode required 7) Load Real-Time Registers All time registers (including Leap Years and AMPM bit) may now be loaded in any order Note that when writing to the clock setting register to set up Leap Years and AMPM the Hours Mode bit must not be altered from the value programmed in step 5 8) Write 0 to the control register This operation finishes the clock initialization by starting the time The final control reg- ister write should be synchronized with an external time source In general timekeeping should be halted before the time data is altered in the clock The data can however be al- tered at any time if so desired Such may be the case if the user wishes to keep the clock corrected without having to stop and restart it ie wintersummer time changing can be accomplished without halting the clock This can be done in software by sensing the state of the data-changed flag and only altering time data just after the time has rolled over (data-changed flag set) TLF11219 – 7 FIGURE 4 Test Mode Organization 9 |
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