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SCANPSC110F Datasheet(PDF) 12 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # SCANPSC110F
Description  SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
PDF  29 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

SCANPSC110F Datasheet(HTML) 12 Page - National Semiconductor (TI)

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Level 2 Protocol (Continued)
1.
Instructions that insert a ’PSC110F register into the ac-
tive scan chain so that the register can be captured or
updated
(BYPASS, SAMPLE/PRELOAD, EXTEST, ID-
CODE, MODESEL, MCGRSEL, LFSRSEL, CNTRSEL).
2.
Instructions that configure local ports or control the op-
eration of the linear feedback shift register and counter
registers
(UNPARK,
PARKTRL,
PARKRTI,
PARK-
PAUSE, GOTOWAIT, SOFTRESET, LFSRON, LFS-
ROFF, CNTRON, CNTROFF). These instructions, along
with any other yet undefined Op-Codes, will cause the
device identification register to be inserted into the ac-
tive scan chain.
LEVEL 2 INSTRUCTION DESCRIPTIONS
BYPASS: The BYPASS instruction selects the bypass regis-
ter for insertion into the active scan chain when the
’PSC110F is selected.
EXTEST:
The
EXTEST
instruction
selects
the
boundary-scan register for insertion into the active scan
chain. The boundary-scan register consists of seven
“sample only” shift cells connected to the S
(0–5) and OE in-
puts. On the ’PSC110F, the
EXTEST instruction performs the
same function as the
SAMPLE/PRELOAD instruction, since
there aren’t any scannable outputs on the device.
SAMPLE/PRELOAD: The SAMPLE/PRELOAD instruction
selects the boundary-scan register for insertion into the ac-
tive scan chain. The boundary-scan register consists of
seven “sample only” shift cells connected to the S
(0–5) and
OE inputs.
IDCODE: The IDCODE instruction selects the device identi-
fication register for insertion into the active scan chain. When
IDCODE is the current active instruction the device identifi-
cation “0FC0E01F” Hex is captured upon exiting the
Capture-DR state.
TABLE 5. Level 2 Protocol and Op-Codes
Instructions
Hex Op-Code
Binary Op-Code
Data Register
BYPASS
FF
11111111
Bypass Register
EXTEST
00
00000000
Boundary-Scan Register
SAMPLE/PRELOAD
81
10000001
Boundary-Scan Register
IDCODE
AA
10101010
Device Identification Register
UNPARK
E7
11100111
Device Identification Register
PARKTLR
C5
11000101
Device Identification Register
PARKRTI
84
10000100
Device Identification Register
PARKPAUSE
C6
11000110
Device Identification Register
GOTOWAIT*
C3
11000011
Device Identification Register
MODESEL
8E
10001110
Mode Register
MCGRSEL
03
00000011
Multi-Cast Group Register
SOFTRESET
88
10001000
Device Identification Register
LFSRSEL
C9
11001001
Linear Feedback Shift Register
LFSRON
0C
00001100
Device Identification Register
LFSROFF
8D
10001101
Device Identification Register
CNTRSEL
CE
11001110
32-Bit TCK Counter Register
CNTRON
0F
00001111
Device Identification Register
CNTROFF
90
10010000
Device Identification Register
Other Undefined
TBD
TBD
Device Identification Register
Note 4: All other instructions act on selected ’PSC110Fs only.
UNPARK: This instruction unparks the Local Scan Port Net-
work and inserts it into the active scan chain as configured
by the Mode register (see
Table 4). Unparked LSPs are se-
quenced synchronously with the ’PSC110F’s TAP controller.
When a LSP has been parked in the
Test-Logic-Reset or
Run-Test/Idle state, it will not become unparked until the
’PSC110F’s TAP Controller enters the
Run-Test/Idle state
following the
UNPARK instruction. If an LSP has been
parked in one of the stable pause states (
Pause-DR or
Pause-IR), it will not become unparked until the ’PSC110F’s
TAP Controller enters the respective pause state. (See
Fig-
ures 9, 10, 11, 12).
PARKTLR: This instruction causes all unparked LSPs to be
parked in the
Test-Logic-Reset TAP controller state and re-
moves the LSP network from the active scan chain. The LSP
controllers keep the LSPs parked in the
Test-Logic-Reset
state by forcing their respective TMS
L output with a constant
logic “1” while the LSP controller is in the
Parked-TLR state
(see
Figure 4 ).
PARKRTI: This instruction causes all unparked LSPs to be
parked in the
Run-Test/Idle state. When a LSP
n is active (un-
parked), its TMS
L signals follow TMSB and the LSPn control-
ler state transitions are synchronized with the TAP Controller
state transitions of the ’PSC110F. When the instruction reg-
ister is updated with the
PARKRTI instruction, TMS
L will be
forced to a constant logic “0”, causing the unparked local
TAP Controllers to be parked in the
Run-Test/Idle state.
When an LSP
n is parked, it is removed from the active scan
chain.
PARKPAUSE: The PARKPAUSE instruction has dual func-
tionality. It can be used to park unparked LSPs or to unpark
parked LSPs. The instruction places all unparked LSPs in
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