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HT66FV240 Datasheet(PDF) 13 Page - Holtek Semiconductor Inc |
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HT66FV240 Datasheet(HTML) 13 Page - Holtek Semiconductor Inc |
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13 / 203 page ![]() Rev. 1.40 1� De�e��e� 1�� �01� Rev. 1.40 13 De�e��e� 1�� �01� HT66FV240 Wireless Voice Flash MCU HT66FV240 Wireless Voice Flash MCU Pad Name Function OPT I/T O/T Description TI+ TI+ — AN — Operational Amplifier non-inverting input TI- TI- — AN — Operational Amplifier inverting input TG TG — — AO Operational Amplifier gain setting output AVSS3 AVSS3 — PWR — Audio PCM A/D �onve�te� negative powe� supply Legend:I/T:Inputtype O/T:Outputtype OPT:Optionalbyconfigurationoption(CO)orregisteroption PWR:Power CO:Configurationoption ST:SchmittTriggerinput AN:Analoginput AO:Analogoutput; CMOS:CMOSoutput NMOS:NMOSoutput SCOM:SoftwarecontrolledLCDCOM HXT:Highfrequencycrystaloscillator LXT:Lowfrequencycrystaloscillator Absolute Maximum Ratings SupplyVoltage................................................................................................VSS−0.3VtoVSS+6.0V InputVoltage..................................................................................................VSS−0.3VtoVDD+0.3V StorageTemperature....................................................................................................-50˚Cto125˚C OperatingTemperature..................................................................................................-40˚Cto85˚C IOLTotal..................................................................................................................................... 80mA IOHTotal....................................................................................................................................-80mA TotalPowerDissipation......................................................................................................... 500mW Note:Thesearestressratingsonly.Stressesexceedingtherangespecifiedunder"AbsoluteMaximum Ratings"maycausesubstantialdamagetothesedevices.Functionaloperationofthesedevicesat otherconditionsbeyondthoselistedinthespecificationisnotimpliedandprolongedexposureto extremeconditionsmayaffectdevicesreliability. |
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