LM4125 datasheet(5/12 Pages) NSC

5 / 12 page

Note 1: “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is

intended to be functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see Electrical Characteristics. The

guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed

test conditions.

Note 2: Without PCB copper enhancements. The maximum power dissipation must be de-rated at elevated temperatures and is limited by TJMAX (maximum

junction temperature),

θJ-A (junction to ambient thermal resistance) and TA (ambient temperature). The maximum power dissipation at any temperature is: PDissMAX

=(TJMAX −TA)/θJ-A up to the value listed in the Absolute Maximum Ratings.

Note 3: The human body model is a 100 pF capacitor discharged through a 1.5 k

Ω resistor into each pin. The machine model is a 200 pF capacitor discharged

directly into each pin.

Note 4: Typical numbers are at 25˚C and represent the most likely parametric norm.

Note 5: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality Control

(SQC) methods. The limits are used to calculate National’s Averaging Outgoing Quality Level (AOQL).

Note 6: Dropout voltage is the differential voltage between VOUT and VIN at which VOUT changes ≤ 1% from VOUT at VIN = 3.3V for 2.0V, 2.5V and 5V for 4.1V. A

parasitic diode exists between input and output pins; it will conduct if VOUT is pulled to a higher voltage than VIN.

Note 7: Thermal hysteresis is defined as the change in +25˚C output voltage before and after exposing the device to temperature extremes.

Note 8: Output noise voltage is proportional to VOUT.VN for other voltage option is calculated using (VN(1.8V)/1.8) * VOUT.VN (2.5V) = (36µVPP/1.8) * 2.5 = 46µVPP.

Note 9: Long term stability is change in VREF at 25˚C measured continuously during 1000 hrs.

LM4125 Datasheet(PDF) 5 Page - National Semiconductor (TI)

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