LM2476 Test Circuits

Figure 4 shows a typical test circuit to evaluate the LM2476 CRT Driver and Bias Clamp electrical characteristics. The driver test

circuit is designed to allow for testing the transient response in a 50

Ω environment without the use of an expensive FET probe.

An input from a 50

Ω pulse generator output can be AC coupled and biased with an external supply via the V

2.49 k

Ω resistors form a 200:1 divider with the 50Ω resistor and the oscilloscope. The clamp test circuit is designed to allow for

testing the clamp outputs. A clamp input can be biased with an external supply via the V

Ω) can be used to measure the DC voltage at the clamp outputs. Test points can included to accommodate voltmeter or

oscilloscope probes.

20121903

Note: 8 pF load includes parasitic capacitance.

FIGURE 4. CRT Driver and Bias Clamp Test Circuits (One Channel)

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