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BAV99WT1 Datasheet(PDF) 2 Page - ON Semiconductor

Part # BAV99WT1
Description  Dual Series Switching Diodes
PDF  4 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

BAV99WT1 Datasheet(HTML) 2 Page - ON Semiconductor

  BAV99WT1 Datasheet HTML 1Page - ON Semiconductor BAV99WT1 Datasheet HTML 2Page - ON Semiconductor BAV99WT1 Datasheet HTML 3Page - ON Semiconductor BAV99WT1 Datasheet HTML 4Page - ON Semiconductor  
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BAV99WT1, BAV99RWT1
http://onsemi.com
2
THERMAL CHARACTERISTICS
Characteristic
Symbol
Max
Unit
Total Device Dissipation FR−5 Board, (Note 1) TA = 25°C
Derate above 25
°C
PD
200
1.6
mW
mW/
°C
Thermal Resistance Junction−to−Ambient
RqJA
625
°C/W
Total Device Dissipation Alumina Substrate, (Note 2) TA = 25°C
Derate above 25
°C
PD
300
2.4
mW
mW/
°C
Thermal Resistance Junction−to−Ambient
RqJA
417
°C/W
Junction and Storage Temperature
TJ, Tstg
− 65 to +150
°C
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Each Diode)
Characteristic
Symbol
Min
Max
Unit
OFF CHARACTERISTICS
Reverse Breakdown Voltage (I(BR) = 100 mA)
V(BR)
70
−
Vdc
Reverse Voltage Leakage Current
(VR = 70 Vdc)
(VR = 25 Vdc, TJ = 150°C)
(VR = 70 Vdc, TJ = 150°C)
IR
−
−
−
2.5
30
50
mAdc
Diode Capacitance
(VR = 0, f = 1.0 MHz)
CD
−
1.5
pF
Forward Voltage
(IF = 1.0 mAdc)
(IF = 10 mAdc)
(IF = 50 mAdc)
(IF = 150 mAdc)
VF
−
−
−
−
715
855
1000
1250
mVdc
Reverse Recovery Time (IF = IR = 10 mAdc, iR(REC) = 1.0 mAdc) (Figure 1) RL = 100 W
trr
−
6.0
ns
Forward Recovery Voltage (IF = 10 mA, tr = 20 ns)
VFR
−
1.75
V
1. FR−5 = 1.0
 0.75  0.062 in.
2. Alumina = 0.4
 0.3  0.024 in. 99.5% alumina.
Notes: (a) A 2.0 k
W variable resistor adjusted for a Forward Current (IF) of 10 mA.
Notes: (b) Input pulse is adjusted so IR(peak) is equal to 10 mA.
Notes: (c) tp » trr
+10 V
2 k
820 W
0.1 mF
DUT
VR
100 mH
0.1 mF
50 W OUTPUT
PULSE
GENERATOR
50 W INPUT
SAMPLING
OSCILLOSCOPE
tr
tp
t
10%
90%
IF
IR
trr
t
iR(REC) = 1 mA
OUTPUT PULSE
(IF = IR = 10 mA; measured
at iR(REC) = 1 mA)
IF
INPUT SIGNAL
Figure 1. Recovery Time Equivalent Test Circuit



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