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AD9731 Datasheet(PDF) 4 Page - Analog Devices |
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AD9731 Datasheet(HTML) 4 Page - Analog Devices |
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4 / 5 page ![]() AD9731 5.0 Package Pin-out: 6.0 Microcircuit Technology Group: The microcircuit is covered by technology group 80. 7.0 Life Test/Burn-In Circuit: Steady state life test is per MIL-STD-883 Method 1005. Burn-in is per MIL-STD-883 Method 1015 test condition B. 8.0 MIL-STD-38535 QMLV exceptions: 8.1 Full WLA per MIL-STD-883 TM 5007 is not available for this product fabricated in a QMLQ wafer process facility. SEM Inspection only is available per MIL-STD-883, TM2018. ASD0011259 Rev. I | Page 4 of 5 |
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